Ferroelectric Properties of Zn- and Ti-doped BiFeO3 Thin Films

被引:8
作者
Lee, M. H. [1 ]
Park, J. S. [1 ]
Cho, H. J. [1 ]
Kim, D. J. [1 ]
Sung, Y. S. [1 ]
Cho, J. H. [1 ]
Kim, M-H. [1 ]
Song, T. K. [1 ]
Kim, W-J. [2 ]
Do, D. [2 ]
Choi, H. I. [2 ]
Kim, S. S. [2 ]
Choi, B. C. [3 ]
机构
[1] Changwon Natl Uniuniv, Sch Nano & Adv Mat Engn, Chang Won 641773, South Korea
[2] Changwon Natl Uniuniv, Dept Phys, Chang Won 641773, South Korea
[3] Pukyong Natl Univ, Dept Phys, Pusan 608737, South Korea
基金
新加坡国家研究基金会;
关键词
Ferroelectric; BiFeO3; Leakage current; Substitution; Orientation; LEAKAGE CURRENT; POLARIZATION; DIFFRACTION;
D O I
10.3938/jkps.60.272
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
BiFeO3 (BFO), Ti-doped BFO (BFTO), and Zn-doped BFO (BFZO) thin films were deposited on Pt(111)/Ti/SiO2/Si(100) substrates by using a pulsed laser deposition method. The effects of the substitution of Zn and Ti were investigated. Increased remnant polarization (P-r) and reduced coercive electric field (2E(c)) were observed in the BFZO thin film capacitor. The values of 2P(r) and 2E(c) of the BFO, BFZO, and BFTO films were 100 mu C/cm(2) and 678 kV/cm, 107 mu C/cm(2) and 540 kV/cm, and 100 mu C/cm(2) and 720 kV/cm, respectively. The measured leakage current density of the BFZO thin film was approximately two orders of magnitude lower than that of the BFO thin film.
引用
收藏
页码:272 / 275
页数:4
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