A physics based compact model describing the fatigue behavior of ferroelectric capacitors has been developed. Fatigue is a gradual decrease of detectable polarization with increasing number of polarization cycles. This can be caused by trapped charges which pin dipoles near the interface to the electrode. In order to polarize those pinned dipoles they have to be separated from the trapped charges by a higher electrical force. This force has been described in our model by additional coercive voltages representing the different polarization response of the dipoles in the interface region in contrast to those in the inner region of the ferroelectric capacitor. Our model has been implemented into a common-used circuit simulator showing good agreement with measurements.
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Univ Paris 11, IEF, F-91405 Orsay, France
CNRS, UMR 8622, F-91405 Orsay, FranceUniv Paris 11, IEF, F-91405 Orsay, France
Wang, Zhaohao
Zhao, Weisheng
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Univ Paris 11, IEF, F-91405 Orsay, France
CNRS, UMR 8622, F-91405 Orsay, FranceUniv Paris 11, IEF, F-91405 Orsay, France
Zhao, Weisheng
Kang, Wang
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Univ Paris 11, IEF, F-91405 Orsay, France
CNRS, UMR 8622, F-91405 Orsay, France
Beihang Univ, Dept Elect Engn, Beijing 100191, Peoples R ChinaUniv Paris 11, IEF, F-91405 Orsay, France
Kang, Wang
Bouchenak-Khelladi, Anes
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Univ Paris 11, IEF, F-91405 Orsay, France
CNRS, UMR 8622, F-91405 Orsay, FranceUniv Paris 11, IEF, F-91405 Orsay, France
Bouchenak-Khelladi, Anes
Zhang, Yue
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Univ Paris 11, IEF, F-91405 Orsay, France
CNRS, UMR 8622, F-91405 Orsay, FranceUniv Paris 11, IEF, F-91405 Orsay, France
Zhang, Yue
Zhang, Youguang
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Beihang Univ, Dept Elect Engn, Beijing 100191, Peoples R ChinaUniv Paris 11, IEF, F-91405 Orsay, France
Zhang, Youguang
Klein, Jacques-Olivier
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Univ Paris 11, IEF, F-91405 Orsay, France
CNRS, UMR 8622, F-91405 Orsay, FranceUniv Paris 11, IEF, F-91405 Orsay, France
Klein, Jacques-Olivier
Ravelosona, Dafine
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Univ Paris 11, IEF, F-91405 Orsay, France
CNRS, UMR 8622, F-91405 Orsay, FranceUniv Paris 11, IEF, F-91405 Orsay, France
Ravelosona, Dafine
Chappert, Claude
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Univ Paris 11, IEF, F-91405 Orsay, France
CNRS, UMR 8622, F-91405 Orsay, FranceUniv Paris 11, IEF, F-91405 Orsay, France