Lifetime of OLED-on-Silicon Microdisplay Based on Luminance Decay Model

被引:5
作者
Ji Yuan [1 ,2 ]
Gong Shuping [1 ]
Mu Tingzhou [2 ]
Chen Wendong [2 ]
Zhang Kaiwen [1 ]
机构
[1] Shanghai Univ, Microelect Res & Dev Ctr, Shanghai 200072, Peoples R China
[2] Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China
关键词
optical devices; OLED-on-silicon microdisplay; luminance decay model; lifetime prediction; aging; duty cycle;
D O I
10.3788/AOS202141.1923003
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Through aging experiments, an organic light-emitting diode (OLED) luminance decay model based on a restoration model is proposed to study the lifetime of OLED-on-silicon microdisplays. The luminance decay model is a fusion of the traditional stretched exponential decay and OLED brightness restoration models. The brightness degradation data is used to fit the undetermined parameters in the attenuation model to obtain the qualitative and quantitative relationship between the initial brightness and duty cycle and the life of the OLED to realize the high-precision brightness attenuation prediction of the OLED. Comparing with the measured, it can be concluded that the prediction error of the proposed model is small, and the fitting accuracy is as high as 99. 22%. Under the same initial brightness drive, the life prediction accuracy of OLED can be improved by 79. 1%. The lifetime performance of OLED-on-silicon microdisplay driven by pulse-width modulation (PWM) is superior to that of traditional current/ voltage driven types. At a duty ratio of 12. 5%-87. 5%, the lifetime of OLED-on-silicon microdisplays can be increased by 1.6-20. 9 times.
引用
收藏
页数:8
相关论文
共 22 条
[11]   Organic-Light-Emitting-Diode-on-Silicon Microdisplay Based on Double-Frame Digital-Analog-Hybrid Scanning Strategy [J].
Mu Tingzhou ;
Ji Yuan ;
Chen Wendong ;
Yu Yunsen ;
Ran Feng .
LASER & OPTOELECTRONICS PROGRESS, 2019, 56 (09)
[12]   Lifetime Extension Method for Active Matrix Organic Light-Emitting Diode Displays Using a Modified Stretched Exponential Decay Model [J].
Oh, Kyonghwan ;
Hong, Seong-Kwan ;
Kwon, Oh-Kyong .
IEEE ELECTRON DEVICE LETTERS, 2015, 36 (03) :277-279
[13]  
SchmidbauerS HohenleutnerA, 2013, ADV MATER, V25, P15
[14]  
ShenJ Wang D, 2000, J SYNTHETIC METALS, P233
[15]  
Yoshioka T., 2014, SID Symposium Digest of Technical Papers, V45, P642, DOI [10.1002/j.2168-0159.2014.tb00168.x, DOI 10.1002/J.2168-0159.2014.TB00168.X]
[16]  
YoshiokaT SugimotoK, 2015, J SID S DIGESTOF TEC, V46, P1650
[17]   Experimental test and life estimation of the OLED at normal working stress based on the luminance degradation model [J].
Zhang, J. P. ;
Wang, C. ;
Chen, X. ;
Cheng, G. L. ;
Qiu, Y. J. ;
Shen, M. -H. H. .
LUMINESCENCE, 2015, 30 (04) :371-375
[18]  
Zhang Jian-ping, 2012, Chinese Journal of Liquid Crystals and Displays, V27, P187, DOI 10.3788/YJYXS20122702.0187
[19]   A Novel Model of Life Prediction for Photoelectric Products and Its Application [J].
Zhang Jianping ;
Zong Yu ;
Zhu Wenqing ;
Yi Meng .
ACTA OPTICA SINICA, 2018, 38 (02)
[20]  
Zhang W, 2011, J JOUNALOF PHYS APPL, V4415, P773