Surface structure determination of silica single layer on Mo(112) by LEED

被引:6
|
作者
Kinoshita, Tetsuhiro [1 ]
Mizuno, Seigi [1 ]
机构
[1] Kyushu Univ, Dept Mol & Mat Sci, Fukuoka 8168580, Japan
关键词
Low energy electron diffraction (LEED); Molybdenum; Silicon oxides; DIOXIDE FILMS; SIO2; GROWTH;
D O I
10.1016/j.susc.2011.04.003
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The atomic structure of silica single layer on a Mo(112) substrate was determined by means of low-energy electron diffraction analysis. The best-fit structure was consistent with findings of previous studies [Phys. Rev. Lett. 95 (2005) 076103 and Phys. Rev. Lett. 103 (2009) 017601]. The unit cell is c(2 x 2)-Si2O5 and is composed of a two-dimensional network of SiO4 tetrahedrons. The tetrahedrons incline slightly to fit the silica network on the Mo(112) surface while maintaining the ideal Si-O bond length. Since there are no dangling bonds in the silica network, the surface is very stable even in the atmosphere. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:1209 / 1213
页数:5
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