Tantalum effects on the ICP-OES determination of trace elements in tantalum powder

In this study, the trace elements Zr, Mo, Cu, Mn, Mg, Co, W, Ca, B, and Al are determined in tantalum powder, using a 0.64-m monochromator inductively coupled plasma spectrometer. The effects of tantalum in the determination of trace level impurities were studied by determining these elements in solutions containing tantalum from 1000 to 20,000 mg/L. As the concentration of tantalum is increased, the Zr, Mo, Co, W, and Al decreases in intensity counts while Cu and Mn showed an increase in intensity counts. In the case of boron, there was no change in intensity. For Ca and Mg, +1 states showed an increase in intensity and +2 states showed a decrease. The relative standard intensities of trace elements in the tantalum matrix were calculated from 1000 to 20,000 mg/L tantalum solutions. Spectral line profiles of the trace elements and spectral overlaps of tantalum at 1000 mg/L for interference-free line selection is presented and discussed.