Ferromagnetism in ZnTe:Cr film grown on Si(100)

被引:8
|
作者
Soundararajan, D. [2 ,6 ]
Peranantham, P. [2 ,3 ]
Mangalaraj, D. [1 ,2 ]
Nataraj, D. [2 ]
Dorosinskii, L. [4 ]
Santoyo-Salazar, J. [5 ]
Ko, J. M. [6 ]
机构
[1] Bharathiar Univ, Dept Nanosci & Technol, Coimbatore 641046, Tamil Nadu, India
[2] Bharathiar Univ, Dept Phys, Thin Films & Nanomat Lab, Coimbatore 641046, Tamil Nadu, India
[3] INPL ENSG, CNRS, UMR 7569, Lab Environm & Mineralurgie, F-54501 Vandoeuvre Les Nancy, France
[4] Natl Inst Metrol TUBITAK UME, TR-41470 Gebze, Turkey
[5] Inst Politecn Nacl, Ctr Invest & Estudios Avanzados, Dept Fis, Mexico City 07000, DF, Mexico
[6] Hanbat Natl Univ, Div Appl Chem & Biotechnol, Yusong 305719, Daejon, South Korea
关键词
ZnTe:Cr film; Magnetic domains; M-H curve; M-T measurements; MAGNETIC SEMICONDUCTOR ZN1-XCRXTE; ROOM-TEMPERATURE FERROMAGNETISM; MBE;
D O I
10.1016/j.jallcom.2010.08.103
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Zn(1-x)Cr(x)Te (x = 0.0 and 0.05) films were grown on Si(1 0 0) substrate by using thermal evaporation method. The structure of the films was investigated by X-ray diffraction and it showed the formation of ZnCrTe phase with an amorphous background, which indicated poor crystallinity. Composition analysis by XPS disclosed the presence of antiferromagnetic Cr(2)O(3) and Cr precipitates. Magnetic domains were observed by using magnetic force microscopy at ambient temperature and the result showed anisotropic domains with an average size of 3.5 nm. Magnetic field dependence of magnetic moment measurements showed obvious hysteresis loop with a coercive field of 121 Oe at 300 K. Temperature dependence of magnetic moment showed short-range ferromagnetic order. The Curie temperature was estimated to be 354.5 K. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:80 / 86
页数:7
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