Efficient simulation-based discrete optimization

被引:0
作者
Guikema, SD [1 ]
Davidson, RA [1 ]
Çagnan, Z [1 ]
机构
[1] Cornell Univ, Sch Civil & Environm Engn, Ithaca, NY 14850 USA
来源
PROCEEDINGS OF THE 2004 WINTER SIMULATION CONFERENCE, VOLS 1 AND 2 | 2004年
关键词
D O I
暂无
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
In many practical applications of simulation it is desirable to optimize the levels of integer or binary variables that are inputs for the simulation model. In these cases, the objective function must often be estimated through an expensive simulation process, and the optimization problem is NP-hard, leading to a computationally difficult problem. We investigate efficient solution methods for this problem, and we propose an approach that reduces the number of runs of the simulation by using ridge regression to approximate some of the simulation calls. This approach is shown to significantly decrease the computational cost but at a cost of slightly worse solution values.
引用
收藏
页码:536 / 544
页数:9
相关论文
共 16 条
  • [1] AIZAWA AN, 1993, PROCEEDINGS OF THE FIFTH INTERNATIONAL CONFERENCE ON GENETIC ALGORITHMS, P48
  • [2] A two-stage methodology for short-term batch plant scheduling: discrete-event simulation and genetic algorithm
    Azzaro-Pantel, C
    Bernal-Haro, L
    Baudet, P
    Domenech, S
    Pibouleau, L
    [J]. COMPUTERS & CHEMICAL ENGINEERING, 1998, 22 (10) : 1461 - 1481
  • [3] CHIPPERFIELD A, 1994, GEN ALGORITHM TOOLBO
  • [4] Davidson R., 2004, PROC 13 WORLD C EART
  • [5] DAVIDSON RA, 2004, RES ACCOMPLISHMENTS
  • [6] GIGUERE P, 1998, P 3 ANN GEN PROGR C, V1
  • [7] RIDGE REGRESSION - BIASED ESTIMATION FOR NONORTHOGONAL PROBLEMS
    HOERL, AE
    KENNARD, RW
    [J]. TECHNOMETRICS, 1970, 12 (01) : 55 - &
  • [8] Composite sandwich structure optimization with application to satellite components
    Kodiyalam, S
    Nagendra, S
    DeStefano, J
    [J]. AIAA JOURNAL, 1996, 34 (03) : 614 - 621
  • [9] LEE YH, 1985, P 1985 WINT SIM C, P173
  • [10] SOME COMMENTS ON CP
    MALLOWS, CL
    [J]. TECHNOMETRICS, 1973, 15 (04) : 661 - 675