Marchand balun embedded probe

被引：11

作者：

Jung, Kooho ^{[1
]}

Campbell, Richard L. ^{[2
]}

Hanaway, Peter ^{[1
]}

Andrews, Michael F. ^{[1
]}

McCuen, Carol ^{[1
]}

Eisenstadt, William R. ^{[3
]}

Fox, Robert M. ^{[3
]}

机构：

[1] Cascade Microsoft Inc, Beaverton, OR 97006 USA

[2] Portland State Univ, Dept Elect & Comp Engn, Portland, OR 97201 USA

[3] Univ Florida, Dept Elect & Comp Engn, Gainesville, FL 32611 USA

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2008年 / 56卷 / 05期

关键词：

coupled transmission lines; differential measurement; Marchand balun; on-wafer probe; planar balun;

D O I：

10.1109/TMTT.2008.921702

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Planar-type Marchand baluns are embedded into on-wafer probes in order to provide accurate differential measurement capabilities for conventional single-ended measurement equipments such as the two-port vector network analyzer. In designing the planar-type Marchand balun, the values for differential- and common-mode characteristic impedances of the coupled transmission lines are analytically derived by using general transmission line theories. The derived characteristic impedances are realized using a double-sided single-layer printed circuit board surrounded by conductive fixtures. The proposed coupled transmission line structure provides convenient port interfaces to the coaxial cables and it is free from bond wires and vias, enabling one to achieve high cost efficiency and reproducibility.

引用

页码：1207 / 1214

页数：8

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