Lithium battery surface defect detection based on the YOLOv3 detection algorithm

被引:2
作者
Lang, Xianli [1 ]
Zhang, Yu [1 ]
Shu, Shuangbao [1 ]
Liang, Huajun [1 ]
Zhang, Yuzhong [1 ]
机构
[1] Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Peoples R China
来源
TENTH INTERNATIONAL SYMPOSIUM ON PRECISION MECHANICAL MEASUREMENTS | 2021年 / 12059卷
关键词
Defect detection; Convolutional neural network; Image processing; K-means clustering algorithm; YOLOv3;
D O I
10.1117/12.2615289
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
With the continuous development of science and technology, cylindrical lithium batteries, as new energy batteries, are widely used in many fields. In the production process of lithium batteries, various defects may occur. To detect the defects of lithium batteries, a detection algorithm based on convolutional neural networks is proposed in this paper. Firstly, image preprocessing is introduced on the collected lithium battery dataset. Secondly, the K-means clustering algorithm is used on the preprocessed dataset to generate anchor boxes for lithium battery defect detection. Then the detection network YOLOv3 is trained with the given dataset. Finally, the detection network YOLOv3 is applied to output the type and location information of the defect. The experimental results show that the mean average precision (mAP) value of the detection algorithm on the lithium battery validation dataset reaches 94% and the detection speed is 25 frames per second. The proposed algorithm can effectively locate and classify the bottom defects of the lithium battery.
引用
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页数:8
相关论文
共 15 条
[1]  
[Anonymous], CoRR
[2]  
Fu C.Y., 2017, arXiv
[3]  
Hartigan J. A., 1979, Applied Statistics, V28, P100, DOI 10.2307/2346830
[4]   Deep Residual Learning for Image Recognition [J].
He, Kaiming ;
Zhang, Xiangyu ;
Ren, Shaoqing ;
Sun, Jian .
2016 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2016, :770-778
[5]  
Ke W., 2021, J PHYS C SERIES, V1884
[6]   Focal Loss for Dense Object Detection [J].
Lin, Tsung-Yi ;
Goyal, Priya ;
Girshick, Ross ;
He, Kaiming ;
Dollar, Piotr .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2020, 42 (02) :318-327
[7]   SSD: Single Shot MultiBox Detector [J].
Liu, Wei ;
Anguelov, Dragomir ;
Erhan, Dumitru ;
Szegedy, Christian ;
Reed, Scott ;
Fu, Cheng-Yang ;
Berg, Alexander C. .
COMPUTER VISION - ECCV 2016, PT I, 2016, 9905 :21-37
[8]  
Redmon J, 2018, Arxiv, DOI arXiv:1804.02767
[9]   YOLO9000: Better, Faster, Stronger [J].
Redmon, Joseph ;
Farhadi, Ali .
30TH IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2017), 2017, :6517-6525
[10]   You Only Look Once: Unified, Real-Time Object Detection [J].
Redmon, Joseph ;
Divvala, Santosh ;
Girshick, Ross ;
Farhadi, Ali .
2016 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2016, :779-788