Topic modelling approach to knowledge depth and breadth: Analyzing trajectories of technological knowledge

被引:0
作者
Suominen, Arho [1 ]
机构
[1] VTT Tech Res Ctr Finland, Espoo, Finland
来源
2017 IEEE TECHNOLOGY & ENGINEERING MANAGEMENT SOCIETY CONFERENCE (TEMSCON) | 2017年
基金
芬兰科学院;
关键词
Technology trajectories; Unsupervised learning; Technological diversity; INNOVATION; DIVERSIFICATION; BASE; CONVERGENCE; EXPLORATION; PERFORMANCE; SIMILARITY; DOCUMENTS; INVENTION; SYSTEM;
D O I
暂无
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Technology assessment and planning requires that we can reliably, but indirectly, measure knowledge embedded in the organization. Operationalizing knowledge embedded into companies is increasingly challenging but also more and more relevant in the current cross-disciplinary and complex technological environment. Existing approaches for operationalizing company knowledge are based on patent data and analyzing patent classifications. These approaches have, however, significant limitations. In this study, knowledge depth and breadth is studied using full-text patent data from seven large telecommunication companies totaling 157,718 patents. The data was analyzed with Latent Dirichlet Allocation, an unsupervised learning method. The results are quantified using a technological diversity metric, showing temporal changes in companies knowledge. The result show how the operationalization of company knowledge is independent of patent count and that companies have their specific trajectory of knowledge development. The approach offers a novel method of analyzing the knowledge trajectory of a company, compared to existing patent classification based methods.
引用
收藏
页码:55 / 60
页数:6
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