Study of various n-type organic semiconductors on ultraviolet detective and electroluminescent properties of optoelectronic integrated device

被引:4
作者
Deng, Chaoxu [1 ]
Shao, Bingyao [1 ]
Zhao, Dan [1 ]
Zhou, Dianli [1 ]
Yu, Junsheng [1 ]
机构
[1] Univ Elect Sci & Technol China, Sch Optoelect Informat, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China
基金
中国国家自然科学基金;
关键词
ultraviolet detective; electroluminescent; organic optoelectronic integrated device; n-type organic semiconductors; LIGHT-EMITTING-DIODES; ACTIVATED DELAYED FLUORESCENCE; ANTHRACENE-DERIVATIVES; TRANSPORT MATERIALS; EFFICIENT; PERFORMANCE; LAYER; POLYMER; DEPENDENCE; HOLE;
D O I
10.1088/1361-6641/aa8b28
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Organic optoelectronic integrated device (OID) with both ultraviolet (UV) detective and electroluminescent (EL) properties was fabricated by using a thermally activated delayed fluorescence (TADF) semiconductor of (4s, 6s)-2,4,5,6-tetra(9H-carbazol-9-yl) isophthalonitrile (4CzIPN) as an emitter. The effect of five kinds of n-type organic semiconductors (OSCs) on the enhancement of UV detective and EL properties of OID was systematically studied. The result shows that two orders of magnitude in UV detectivity from 10(9) to 10(11) Jones and 3.3 folds of luminance from 2499 to 8233 cd m(-2) could be achieved. The result shows that not only the difference of lowest unoccupied molecular orbital (LUMO) between active layer and OSC but also the variety of electron mobility have a significant effect on the UV detective and EL performance through adjusting electron injection/transport. Additionally, the optimized OSC thickness is beneficial to confine the leaking of holes from the active layer to cathode, leading to the decrease of dark current for high detective performance. This work provides a useful method on broadening OSC material selection and device architecture construction for the realization of high performance OID.
引用
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页数:8
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