In situ high-resolution transmission electron microscopy of dislocation formation and dynamics during the crystallization of amorphous SrTiO3

被引：7

作者：

Lee, SB ^{[1
]}

Sigle, W ^{[1
]}

Phillipp, F ^{[1
]}

Brunner, D ^{[1
]}

机构：

[1] Max Planck Inst Met Res, D-70569 Dresden, Germany

来源：

ACTA MATERIALIA | 2005年 / 53卷 / 06期

关键词：

high-resolution transmission electron microscopy; perovskites; crystallization; dislocations;

D O I：

10.1016/j.actamat.2004.12.034

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In situ high-resolution TEM imaging of an ion-milled SrTiO3 sample during annealing at 925 and 940 degrees C is reported. Regions that were amorphized during the ion-milling at room temperature are observed to crystallize, forming low-angle grain boundaries. At the grain boundaries, perfect alpha < 0 0 1 > dislocations and two climb-dissociated alpha/2 < 0 1 1 > dislocations were observed. The experimental observations also include dynamic dislocation phenomena, such as glide, climb, and annihilation. Interestingly, the separation of the two alpha < 2 0 1 > partial dislocations in the low-angle grain boundaries is not constant, but temporarily fluctuates around a mean value of 2 nm. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：1843 / 1848

页数：6

共 11 条

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