a Dependence of Excess Noise on the Partial Derivatives of Resistance in Superconducting Transition Edge Sensors

被引：17

作者：

Jethava, Nikhil ^{[1
]}

Ullom, Joel N. ^{[2
]}

Irwin, Kent D. ^{[2
]}

Doriese, W. B. ^{[2
]}

Beall, J. A. ^{[2
]}

Hilton, G. C. ^{[2
]}

Vale, L. R. ^{[2
]}

Zink, Barry ^{[3
]}

机构：

[1] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA

[2] NIST, Boulder, CO 80305 USA

[3] Univ Denver, Dept Phys & Astron, Denver, CO 80208 USA

来源：

LOW TEMPERATURE DETECTORS LTD 13 | 2009年 / 1185卷

关键词：

Superconducting Transition Edge Sensors; Microcalorimeter; Excess noise; Unexplained noise;

D O I：

10.1063/1.3292343

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have measured the relation between sensor noise and the steepness (alpha = T/R.dR/dT and beta I/R.dR/dI of the superconducting transition for various superconducting transition edge sensors. The measurements are performed on square Mo/Cu bilayer thermistors of three sizes (125 mu m, 250 mu m and 400 mu m), which are fabricated for X-ray detection. We have identified the devices in two regimes: a) alpha > 100 and b) alpha < 100. The devices with a smaller than 100 strictly follow non-linear bolometer and micro-calorimeter noise theory while in most devices with a greater than 100, we see an unexplained noise contribution.

引用

页码：31 / +

页数：2

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