On the crystallographic study of growth characterization of isolated void in the grain boundary

被引:11
作者
Wen, Z. X. [1 ]
Yue, Z. F. [1 ]
机构
[1] Northwestern Polytech Univ, Dept Engn Mech, Xian 710072, Peoples R China
基金
中国国家自然科学基金;
关键词
bicrystal; void growth; grain boundary; resolved shear stress;
D O I
10.1016/j.commatsci.2006.11.008
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The growth characterization of an isolated spherical void in the grain boundary of anisotropic bicrystals was studied. The emphasis was placed on the role of the grain boundaries (perpendicular, tilt and parallel grain boundary) with respect to the external mechanical loading. The three-dimensional rate-dependent crystallographic model was applied in this paper. It is found that the resolved shear stress has a constant value in the mid-section of two grains. And there is high stress gradient and high stress concentration near the grain boundary, especially close to the void. The stress concentrations and growth of the void are greatly dependent on crystallographic orientations of grains and loading direction. The void grows more easily in the grain boundary perpendicular to the loading direction. In addition, the existence of void induces a complex activation of slip systems. (c) 2006 Elsevier B.V. All rights reserved.
引用
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页码:140 / 146
页数:7
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