Charge pump with perfect current matching characteristics in phase-locked loops

被引：171

作者：

Lee, JS ^{[1
]}

Keel, MS

Lim, SI

Kim, S

机构：

[1] Korea Univ, Dept Elect Engn, Sungbuk Gu, Seoul 136701, South Korea

[2] Seokyeong Univ, Dept Comp Engn, Sungbuk Gu, Seoul 136704, South Korea

来源：

ELECTRONICS LETTERS | 2000年 / 36卷 / 23期

关键词：

Amplifiers (electronic) - CMOS integrated circuits - Variable frequency oscillators;

D O I：

10.1049/el:20001358

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Conventional CMOS charge pump circuits have some current mismatching characteristics. The current mismatch of the charge pump in the PLLs generates a phase offset, which increases spurs in the PLL output signals, in particular, it reduces the locking range in wide range PLLs with a dual loop scheme. A new charge pump circuit with perfect current matching characteristics is proposed. By using an error amplifier and reference current sources, one can achieve a charge pump with good current matching characteristics. It shows nearly perfect current matching characteristics over the whole VCO input range, and the amount of the reference spur is < -75dBc in the PLL output signal. The charge pump circuit is implemented in a 0.25<mu>m CMOS process.

引用

页码：1907 / 1908

页数：2

共 4 条

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Lee, WH
Cho, JD
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[3] Rhee W, 1999, ISCAS '99: PROCEEDINGS OF THE 1999 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 2, P545, DOI 10.1109/ISCAS.1999.780807
[4] ANALYSIS OF A CHARGE-PUMP PLL - A NEW MODEL
VANPAEMEL, M
[J]. IEEE TRANSACTIONS ON COMMUNICATIONS, 1994, 42 (07) : 2490 - 2498

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