Economical methods for SiC JFET's short-circuit protection using commercial gate drivers

被引:0
|
作者
Rodrigues, Rostan [1 ]
Song, Xiaoqing [1 ]
机构
[1] ABB US Corp Res Ctr, Raleigh, NC 27606 USA
来源
2019 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE) | 2019年
关键词
gate driver; normally-on; SiC JFET; negative bias; DESAT; short-circuit protection;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
This paper presents several economical methods for retrofitting commercially available gate drivers for IGBTs and SiC MOSFETs to drive SiC JFETs and to protect the SiC JFETs during short circuit and overcurrent conditions. The SiC JFETs are finding increasing interest for many emerging applications due to their unique properties, like lower specific on-resistance, high temperature operation potential without gate oxide concerns, etc. However, the normally-on characteristics and distinct gate driver voltage requirements (0 V to turn on and -15 V to turn off) place challenges to adopt commercial gate drivers directly to SiC JFETs, especially to realize short-circuit protection. The presented methods are developed based on the commercial gate drivers which allows fast prototyping and design cycles of SiC JFET based power electronics. A comparison between the proposed methods is provided with recommendations for implementation. This paper would provide a useful reference for designers working on SiC JFET based power electronic designs.
引用
收藏
页码:2401 / 2407
页数:7
相关论文
共 34 条
  • [1] Comparative Design of Gate Drivers with Short-Circuit Protection Scheme for SiC MOSFET and Si IGBT
    Yin, Shan
    Wu, Yingzhe
    Liu, Yitao
    Pan, Xuewei
    ENERGIES, 2019, 12 (23)
  • [2] Review on Short-Circuit Protection Methods for SiC MOSFETs
    Lyu, Gang
    Ali, Hamid
    Tan, Hongrui
    Peng, Lyuzhang
    Ding, Xiaofeng
    ENERGIES, 2024, 17 (17)
  • [3] Failure Models and Comparison on Short-Circuit Performances for SiC JFET and SiC MOSFET
    Zhou Y.-M.
    Liu H.-Z.
    Yang T.-T.
    Chen Z.-Q.
    Tien Tzu Hsueh Pao/Acta Electronica Sinica, 2019, 47 (03): : 726 - 733
  • [4] Failure Models and Comparison on Short-circuit Performances for SiC JFET and SiC MOSFET
    Zhou, Yuming
    Yang, Tingting
    Liu, Hangzhi
    Wang, Bing
    2018 1ST WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS IN ASIA (WIPDA ASIA), 2018, : 123 - +
  • [5] Short-Circuit Protection for GaN Power Devices with Integrated Current Limiter and Commercial Gate Driver
    Bisi, Davide
    Nguyen, Long
    Zuk, Philip
    Gokhale, Ashish
    Coffey, Keith
    Liu, Ted
    Cruse, Bill
    Hosoda, Tsutomu
    Kamiyama, Masamichi
    Parikh, Primit
    Mishra, Umesh
    2022 IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION, APEC, 2022, : 181 - 185
  • [6] Gate Driver Protection Methods for SiC MOSFET Short Circuit Testing
    Nevarez, Jairo
    Olmedo, Anthony
    Williams, Rachel
    Pechnikova, Polina
    2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2021,
  • [7] Performance and Short-Circuit Reliability of SiC MOSFETs With Enhanced JFET Doping Design
    Lin, Chaobiao
    Ren, Na
    Xu, Hongyi
    Sheng, Kuang
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 70 (05) : 2395 - 2402
  • [8] Short-circuit protection for an IGBT with detecting the gate voltage and gate charge
    Hasegawa, K.
    Yamamoto, K.
    Yoshida, H.
    Hamada, K.
    Tsukuda, M.
    Omura, I.
    MICROELECTRONICS RELIABILITY, 2014, 54 (9-10) : 1897 - 1900
  • [9] Review of Short-circuit Protection Circuits for SiC MOSFETs
    Lee, Seungjik
    Lee, Ockgoo
    Nam, Ilku
    JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2023, 23 (02) : 128 - 137
  • [10] Overcurrent and Short-Circuit Protection Method using Desaturation Detection of SiC MOSFET
    Kim, Jinwoo
    Cho, Younghoon
    2020 IEEE PELS WORKSHOP ON EMERGING TECHNOLOGIES: WIRELESS POWER TRANSFER (WOW), 2020, : 197 - 200