An investigation on linear and non-linear optical constants of nano-spherical CuPc thin films for optoelectronic applications

被引：33

作者：

Yahia, I. S. ^{[1
,2
]}

Ganesh, V. ^{[2
]}

Shkir, M. ^{[2
]}

AlFaify, S. ^{[2
]}

Zahran, H. Y. ^{[1
,2
]}

Algarni, H. ^{[2
]}

Abutalib, M. M. ^{[3
]}

Al-Ghamdi, AttiehA. ^{[3
]}

El-Naggar, A. M. ^{[4
]}

AlBassam, A. M. ^{[4
]}

机构：

[1] Ain Shams Univ, Fac Educ, Dept Phys, Met Lab,Nanosci & Semicond Labs, Cairo, Egypt

[2] King Khalid Univ, Fac Sci, Dept Phys, AFMOL, POB 9004, Abha, Saudi Arabia

[3] King Abdulaziz Univ, Fac Sci, Ctr Nanotechnol, Dept Phys, AL Faisaliah Campus, Jeddah, Saudi Arabia

[4] King Saud Univ, Coll Sci, Dept Phys & Astron, Res Chair Exploitat Renewable Energy Applicat Sau, POB 2455, Riyadh 11451, Saudi Arabia

来源：

PHYSICA B-CONDENSED MATTER | 2016年 / 496卷

关键词：

Thin films; Semiconductors; Thermal evaporation; Optical properties; Nonlinear optical properties; REFRACTIVE-INDEX; PHTHALOCYANINE; ABSORPTION; CHALCOGENIDES; DERIVATIVES; ROUGHNESS;

D O I：

10.1016/j.physb.2016.05.020

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

In the current work, the authors present the systematic study on linear and nonlinear optical properties of Copper-phathalocyanine thin film deposited by thermal evaporation system for the first time. The thickness of the prepared thin film was measured and found to be similar to 300 nm. X-ray diffraction and AFM study confirms that the prepared thin film possess good quality. The orientation of the grown thin film is found to be along (100). UV-vis-NIR study shows that the deposited thin film is highly transparent ( > 80%) in the wavelength range of 700-2500 nm. Further, the recorded optical data was used to determine the various linear and nonlinear optical parameters. The calculated value of refractive index is found to be in the range of 0.4-1.0. The direct and indirect band gap value is found to be 2.9 and 3.25 eV, respectively. The value of linear and nonlinear susceptibilities is found to be in order of 10(-12). The higher value of linear and nonlinear parameters makes it suitable for optoelectronic applications. (C) 2016 Elsevier B.V. All rights reserved.

引用

页码：9 / 14

页数：6

共 38 条

[1] NONLINEAR REFRACTIVE-INDEX OF OPTICAL-CRYSTALS [J].