Studying nematic liquid crystals by spectroscopic ellipsometry

被引：6

作者：

Tkachenko, Volodymyr ^{[1
,2
]}

Marino, Antigone ^{[1
,2
]}

Abbate, Giancarlo ^{[1
,2
]}

机构：

[1] Univ Naples Federico II, CNR SPIN, I-80126 Naples, Italy

[2] Univ Naples Federico II, Dipartimento Sci Fis, I-80126 Naples, Italy

来源：

JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY | 2010年 / 18卷 / 11期

关键词：

Spectroscopic ellipsometry; liquid crystals; refractive index; tilt angle; anchoring energy; TRANSMISSION ELLIPSOMETRY; REFRACTIVE-INDEXES; MUELLER-MATRIX; THIN-FILMS;

D O I：

10.1889/JSID18.11.896

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The optical characterization of liquid crystals, in a wide spectral range, is becoming a very important technical task because of their expanding applications in displays, optical telecommunications and other advanced areas of science and engineering. One of the most versatile, sensitive, and well-established technique for the optical characterization of solid and liquid materials is spectroscopic ellipsometry. In this paper, an outline is presented on the use of ellipsometry for nematic liquid-crystal characterization: anisotropic refractive-indices measurements and their temperature dependence, anchoring energy, and tilt distribution inside cells will be discussed. The paper is an extended version of a previously published paper.(1)

引用

页码：896 / 903

页数：8

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