Single-shot terahertz pulse characterization via two-dimensional electro-optic imaging with dual echelons

被引：80

作者：

Kim, K. Y. ^{[1
]}

Yellampalle, B. ^{[1
]}

Taylor, A. J. ^{[1
]}

Rodriguez, G. ^{[1
]}

Glownia, J. H. ^{[1
]}

机构：

[1] Los Alamos Natl Lab, Ctr Integrated Nanotechnol, Los Alamos, NM 87545 USA

来源：

OPTICS LETTERS | 2007年 / 32卷 / 14期

关键词：

SPECTROSCOPY; RESOLUTION; TIME;

D O I：

10.1364/OL.32.001968

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A single-shot measurement of terahertz electromagnetic pulses is implemented using two-dimensional electro-optic imaging with dual echelon optics. The reported embodiment produces sequentially delayed multiprobe beamlets, routinely providing a time window of > 10 ps with similar to 25 fs temporal step sizes. Because of its simplicity and robustness, the technique is ideally suited for real-time ultrashort relativistic electron bunch characterization. 2007 Optical Society of America.

引用

页码：1968 / 1970

页数：3

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