Phase shifting Fizeau interferometry of front and back surfaces of optical flats

被引:14
作者
Heil, Joachim [1 ]
Bauer, Tobias [1 ]
Schmax, Stefan [1 ]
Sure, Thomas [1 ]
Wesner, Joachim [1 ]
机构
[1] Leica Microsyst CMS GmbH, D-35578 Wetzlar, Germany
关键词
D O I
10.1364/AO.46.005282
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The interpretation of Fizeau interferograms of optical flats is not straightforward because they are composed of more than two reflections. This results in a confusing fringe pattern. There are three main contributions to the interferogram given by the reflections from the reference surface, the front and the rear surface of the sample. We present a new to the best of our knowledge solution to the problem. We use phase shifting measurements of the wave fields, which are reflected by and transmitted through the sample. This eliminates the need for the suppression of reflections by immersion or other methods. As an illustration of this method, several examples will also be presented. (C) 2007 Optical Society of America.
引用
收藏
页码:5282 / 5292
页数:11
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