Quantum well intermixing enhancement using Ge-doped sol-gel derived SiO2 encapsulant layer in InGaAs/InP laser structure -: art. no. 081106

被引:12
作者
Djie, HS [1 ]
Ho, CKF
Mei, T
Ooi, BS
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
[2] Lehigh Univ, Dept Elect & Comp Engn, Bethlehem, PA 18015 USA
关键词
D O I
10.1063/1.1868867
中图分类号
O59 [应用物理学];
学科分类号
摘要
The intermixing enhancement in InGaAs/InGaAsP quantum well laser structure has been investigated using the Ge-doped sol-gel derived SiO2 encapsulant layer. A band-gap shift of similar to 64 nin has been observed from 16% Ge-doped SiO2 capped sample at the annealing temperature of 630 degrees C with effective intermixing suppression using the e-beam-evaporated SiO2 layer. Ge incorporation in the sol-gel cap reduces the mismatch of thermal expansion coefficients efficiently retaining preferential vacancies, and therefore enhancing the interdiffusion rate. The intermixed material retains a good surface morphology and preserves the optical quality as evidenced by the absence of any appreciable photoluminescence linewidth broadening. (c) 2005 American Institute Of Physics.
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页码:1 / 3
页数:3
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