Design and transmittance measurement of the Ge1-xCx antireflection coatings

被引：0

作者：

Zhan, Chang Yong ^{[1
]}

Wang, Li Wu ^{[1
]}

Dai, Hai Yang ^{[1
]}

Huang, N. K. ^{[1
]}

Wang, Jing Quan ^{[2
]}

机构：

[1] Sichuan Univ, Inst Nucl Sci & Technol, Educ Minist China, Key Lab Radiat & Technol, Chengdu 610064, Peoples R China

[2] Sichuan Univ, Nanophoton Lab, Chengdu 610064, Peoples R China

来源：

JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2008年 / 52卷

关键词：

Ge1-xCx antireflection coatings; gradient index approach; MF or DC magnetron sputtering;

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Ge1-xCx is used as high antireflection and protection coating on ZnS and ZnSe. Ge1-xCx coatings with a type of design of gradient index layers can be used in very broad bands. A technique combining medium frequency (MF) with direct-current (DC) magnetron reactive sputtering was used to deposit Ge1-xCx films based on our theoretical designs. The results according to experimental measurements show that the highest transmittance of Ge1-xCx coated on ZnSe slab can reach 94% at 8.5 mu m, to transmittance value above 80% can be obtained within the whole region of 5.8 - 12 mu m and an average transmittance of 82.4% can be obtained within the range of 2.3 - 14 mu m. The average transmittances of ZnSe slab deposited with Ge1-xCx are 20 - 30% higher than that of ZnSe in the corresponding band area.

引用

页码：S13 / S16

页数：4

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