Progress with epitaxy wrap-through crystalline silicon thin-film solar cells

被引:0
|
作者
Mitchell, Emily J. [1 ,2 ]
Brinkmann, Nils [1 ]
Reber, Stefan [1 ]
机构
[1] Fraunhofer Inst Solar Energy Syst, D-79110 Freiburg, Germany
[2] Univ New S Wales, Sch Photovolta & Renewable Energy Engn, Sydney, NSW 2052, Australia
来源
PROGRESS IN PHOTOVOLTAICS | 2011年 / 19卷 / 06期
关键词
thin film; crystalline silicon; back contact; epitaxy; isolation layer; selective emitter; EMITTERS;
D O I
10.1002/pip.1091
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Wafer-Equivalents are thin-film solar cells that use a low-cost silicon substrate to epitaxially grow a high-quality crystalline silicon active layer. The epitaxy wrap-through (EpiWT) cell is a back-contact version of the Wafer-Equivalent that aims to increase currents and gain other benefits of back contacts. The EpiWT cell can be made in a symmetrically interdigitated configuration with 50% back emitter coverage, or using an isolation layer to lower the back emitter coverage to similar to 10%, which will theoretically increase voltages. The epitaxial deposition through via holes in the substrate depends on many factors, including the sealing of the deposition chamber, and produces various thicknesses and geometrical forms of the layers in the holes. An extended process has been developed to incorporate a passivated selective emitter and the first batch has been fabricated. The best result was an efficiency of 13.2% with similar to 22 mu m base layer thickness. The results are limited most by the fill factors at this stage, e.g. 75% for this cell, which is due to a processing difficulty encountered with screen-printing in via holes. A new isolation layer was tested and successfully implemented for the low back-emitter configuration. Comparable voltages and currents were achieved but the fill factors were lower than for the 50% back emitter cells, resulting in a best efficiency of 11.2%. Copyright (C) 2011 John Wiley & Sons, Ltd.
引用
收藏
页码:706 / 714
页数:9
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