Automated direct comparison of two cryocooled 10 volt programmable Josephson voltage standards

被引:27
作者
Rufenacht, Alain [1 ]
Tang, Yi-hua [2 ]
Solve, Stephane [3 ]
Fox, Anna E. [1 ]
Dresselhaus, Paul D. [1 ]
Burroughs, Charles J. [1 ]
Schwall, Robert E. [1 ]
Chayramy, Regis [3 ]
Benz, Samuel P. [1 ]
机构
[1] NIST, Boulder, CO 80305 USA
[2] NIST, Gaithersburg, MD 20899 USA
[3] BIPM, Pavillon Breteuil, F-92312 Sevres, France
关键词
Digital-analog conversion; Josephson arrays; standards; superconducting integrated circuits; voltage measurement; AC POWER STANDARD; PLANCK CONSTANT; JUNCTIONS; BALANCE;
D O I
10.1088/1681-7575/aacbeb
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We have performed direct dc comparisons between two cryocooled 10 V programmable Josephson voltage standards. Utilizing an automated synchronization scheme for the voltage reversals enables use of a high-sensitivity analog null detector on its 10 mu V range. No switches or manual operations are necessary to protect the null detector from overload signals. The agreement measured between the two voltage standards at 10 V is 9 parts in 10(12) with a relative combined uncertainty of 29 pV V-1 (k = 2 coverage factor). Since both systems can be operated floating from ground, various grounding configurations of the measurement circuit were investigated to evaluate possible leakage current paths to ground. Comparing the two systems under various grounding conditions enables minimization of leakage-current errors, optimization of system performance by revealing leakage-limiting components, and verification of key elements in the uncertainty budget for the measurement method(4).
引用
收藏
页码:585 / 596
页数:12
相关论文
共 36 条
  • [31] Practical high-resolution programmable Josephson voltage standards using double- and triple-stacked MOSi2-barrier junctions
    Chong, Y
    Burroughs, CJ
    Dresselhaus, PD
    Hadacek, N
    Yamamori, H
    Benz, SP
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2005, 15 (02) : 461 - 464
  • [32] A method for using Josephson voltage standards for direct characterization of high performance digitizers to establish AC voltage and current traceability to SI
    Ireland, J.
    Reuvekamp, P. G.
    Williams, J. M.
    Peral, D.
    Diaz de Aguilar, J.
    Sanmamed, Y. A.
    Sira, M.
    Maslan, S.
    Rzodkiewicz, W.
    Bruszewski, P.
    Sadkowski, G.
    Sosso, A.
    Cabral, V
    Malmbekk, H.
    Pokatilov, A.
    Herick, J.
    Behr, R.
    Ozturk, T. Coskun
    Arifovic, M.
    Ilic, D.
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2023, 34 (01)
  • [33] Cross comparison of HP/Key sight 3458As in 100 kHz DCV sampling mode using a Programmable Josephson Voltage Standard
    Reuvekamp, Patrick G.
    Giblin, Stephen P.
    Williams, Jonathan M.
    2024 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CPEM 2024, 2024,
  • [34] A 10 V Josephson Voltage Standard Comparison Between NIST and INMETRO as a Link to BIPM
    Landim, Regis Pinheiro
    Tang, Yi-hua
    Afonso, Edson
    Ferreira, Vitor
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2011, 60 (07) : 2353 - 2358
  • [35] Characterization of the New CERN Metrology-Grade Digitizer Using the 10 V Programmable Josephson Voltage Standard at PTB
    Beev, Nikolai
    Palafox, Luis
    Bastos, Miguel Cerqueira
    Martino, Michele
    Valuch, Daniel
    Behr, Ralf
    2024 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CPEM 2024, 2024,
  • [36] Direct comparison of two NIST PJVS systems at 10 V
    Solve, S.
    Ruefenacht, A.
    Burroughs, C. J.
    Benz, S. P.
    METROLOGIA, 2013, 50 (05) : 441 - 451