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Ionizing radiation and hydrogen peroxide induced oxidative DNA base damage in two L5178Y cell lines
被引:13
|作者:
Zastawny, TH
Kruszewski, M
Olinski, R
机构:
[1] Univ Sch Med Sci, Dept Clin Biochem, PL-85092 Bydgoszcz, Poland
[2] Inst Nucl Chem & Technol, Dept Radiobiol & Hlth Protect, PL-03195 Warsaw, Poland
关键词:
free radical;
DNA damage;
oxidative base damage;
radiation sensitivity;
H2O2;
sensitivity;
D O I:
10.1016/S0891-5849(97)00452-8
中图分类号:
Q5 [生物化学];
Q7 [分子生物学];
学科分类号:
071010 ;
081704 ;
摘要:
Seven oxidized DNA bases were quantified, by gas GC/MS-SIM, in chromatin from gamma-rays and H2O2 treated mouse lymphoma L5178Y (LY) cells, inversely cross-sensitive to these agents. in H2O2 treated cells (2 mM, 1 h, 37 degrees C) we found more damage in LY-R cells than in LY-S cells. On the contrary, in gamma-rays (400 Gy) treated cells we found more damaged DNA bases in LY-S cells. The yield of damaged bases in control cells was similar in both cell Lines, with the exception of 80HAde and FapyGua that were found at a much higher level in LY-S cells. The yields of damaged bases were related to cellular sensitivity to damaging agent; this observation points to a relationship between DNA base damage induction, antioxidant defense system in the intracellular milieu and cell sensitivity. (C) 1998 Elsevier Science Inc.
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页码:1250 / 1255
页数:6
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