Influence of cleaning process on the laser-induced damage threshold of substrates

被引:27
作者
Shen, Zhengxiang [1 ,2 ]
Ding, Tao [1 ,2 ]
Ye, Xiaowen [1 ,2 ]
Wang, Xiaodong [1 ,2 ]
Ma, Bin [1 ,2 ,3 ]
Cheng, Xinbin [1 ,2 ]
Liu, Huasong [1 ,2 ,4 ]
Ji, Yiqin [1 ,4 ]
Wang, Zhanshan [1 ,2 ]
机构
[1] Tongji Univ, Dept Phys, Inst Precis Opt Engn, Shanghai 200192, Peoples R China
[2] Shanghai Key Lab Special Artificial Microstruct M, Shanghai 200092, Peoples R China
[3] Tongji Univ, Sch Aerosp Engn & Appl Mech, Shanghai 200092, Peoples R China
[4] Tianjin Jinhang Inst Tech Phys, Tianjin Key Lab Opt Thin Film, Tianjin 300192, Peoples R China
关键词
SILICA;
D O I
10.1364/AO.50.00C433
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The cleaning process of optical substrates plays an important role during the manufacture of high-power laser coatings. Two kinds of substrates, fused silica and BK7 glass, and two cleaning processes, called process 1 and process 2 having different surfactant solutions and different ultrasonic cleaning parameters, are adopted to compare the influence of the ultrasonic cleaning technique on the substrates. The evaluation standards of the cleaning results include contaminant-removal efficiency, weak absorption, and laser-induced damage threshold of the substrates. For both fused silica and BK7, process 2 is more efficient than process 1. Because acid and alkaline solutions can increase the roughness of BK7, process 2 is unsuitable for BK7 glass cleaning. The parameters of the cleaning protocol should be changed depending on the material of the optical components and the type of contamination. (C) 2011 Optical Society of America
引用
收藏
页码:C433 / C440
页数:8
相关论文
共 17 条
[1]  
Ashe B., 2007, P SPIE, V6720, p67200N
[2]  
Bailey E. S., 2008, P SPIE, V7132
[3]   How to clean surfaces [J].
Bennett, JM .
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2003, 2003, 5273 :195-206
[4]   Photothermal investigation of the laser-induced modification of a single gold nano-particle in a silica film [J].
Bertussi, B ;
Natoli, JY ;
Commandre, M ;
Rullier, JL ;
Bonneau, F ;
Combis, P ;
Bouchut, P .
OPTICS COMMUNICATIONS, 2005, 254 (4-6) :299-309
[5]  
Capoulade J., 2006, P SPIE, V6403
[6]   ABSORPTION MAPPING FOR CHARACTERIZATION OF GLASS SURFACES [J].
COMMANDRE, M ;
ROCHE, P ;
BORGOGNO, JP ;
ALBRAND, G .
APPLIED OPTICS, 1995, 34 (13) :2372-2379
[7]   Photothermal analysis of sub-micrometric scale defects in laser damage studies [J].
Commandré, M ;
Fossati, C ;
Natoli, JY ;
Amra, C .
ADVANCES IN OPTICAL THIN FILMS, 2003, 5250 :158-169
[8]   Nano absorbing centers: A key point in laser damage of thin films. [J].
Dijon, J ;
Poiroux, T ;
Desrumaux, C .
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1996, 1997, 2966 :315-325
[9]   Influence of substrate cleaning on LIDT of 355 nm HR coatings [J].
Dijon, J ;
Garrec, P ;
Kaiser, N ;
Schallenberg, UB .
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1996, 1997, 2966 :178-186
[10]  
Engelhaupt D., 2000, OPTICAL FABRICATION