Microfabricated silicon dioxide cantilever with subwavelength aperture

被引:9
作者
Mitsuoka, Y
Niwa, T
Ichihara, S
Kato, K
Muramatsu, H
Nakajima, K
Shikida, M
Sato, K
机构
[1] Seiko Instruments Inc, Matsudo, Chiba 2702222, Japan
[2] Nagoya Univ, Dept Micro Syst Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan
关键词
aperture; cantilever; focused ion beam; microfabrication; scanning near-field optical microscopy; SiO2;
D O I
10.1046/j.1365-2818.2001.00867.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
We have developed a microfabricated SiO2 cantilever with subwavelength aperture for scanning near-field optical microscopy (SNOM), to overcome the disadvantages of conventional optical fibre probes such as low reproducibility and low optical throughput. The microcantilever, which has a SiO2 cantilever and an aperture tip near the end of the cantilever, is fabricated in a reproducible batch process. The circular aperture with a diameter of 100-150 nm is formed by a focused ion-beam technique. Incident light is directly focused on the aperture from the rear side of the cantilever using a focusing objective, and high optical throughput (10(-2) to 10(-3)) is obtained. The microcantilever can be operated as a SNOM probe in contact mode or in dynamic mode.
引用
收藏
页码:12 / 15
页数:4
相关论文
共 7 条
[1]   Micromachined aperture probe tip for multifunctional scanning probe microscopy [J].
Abraham, M ;
Ehrfeld, W ;
Lacher, M ;
Mayr, K ;
Noell, W ;
Güthner, P ;
Barenz, J .
ULTRAMICROSCOPY, 1998, 71 (1-4) :93-98
[2]   BREAKING THE DIFFRACTION BARRIER - OPTICAL MICROSCOPY ON A NANOMETRIC SCALE [J].
BETZIG, E ;
TRAUTMAN, JK ;
HARRIS, TD ;
WEINER, JS ;
KOSTELAK, RL .
SCIENCE, 1991, 251 (5000) :1468-1470
[3]   Multipurpose sensor tips for scanning near-field microscopy [J].
Mihalcea, C ;
Scholz, W ;
Werner, S ;
Munster, S ;
Oesterschulze, E ;
Kassing, R .
APPLIED PHYSICS LETTERS, 1996, 68 (25) :3531-3533
[4]   Nonuniform silicon oxidation and application for the fabrication of aperture for near-field scanning optical microscopy [J].
Minh, PN ;
Ono, T ;
Esashi, M .
APPLIED PHYSICS LETTERS, 1999, 75 (26) :4076-4078
[5]  
Niwa T, 1999, J MICROSC-OXFORD, V194, P388, DOI 10.1046/j.1365-2818.1999.00549.x
[6]   High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling [J].
Veerman, JA ;
Otter, AM ;
Kuipers, L ;
van Hulst, NF .
APPLIED PHYSICS LETTERS, 1998, 72 (24) :3115-3117
[7]   Novel scanning near-field optical microscopy/atomic force microscope probes by combined micromachining and electron-beam nanolithography [J].
Zhou, H ;
Midha, A ;
Bruchhaus, L ;
Mills, G ;
Donaldson, L ;
Weaver, JMR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (05) :1954-1958