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Phase Evolution, Crystal Structure, and Microwave Dielectric Properties of Water-Insoluble (1-x)LaNbO4-xLaVO4 (0 ≤ x ≤ 0.9) Ceramics
被引:63
|作者:
Guo, Dan
[1
,2
]
Zhou, Di
[1
,2
,4
]
Li, Wen-Bo
[1
,2
]
Pang, Li-Xia
[3
,4
]
Dai, Yan-Zhu
[1
,2
]
Qi, Ze-Ming
[5
]
机构:
[1] Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Shaanxi, Peoples R China
[2] Xi An Jiao Tong Univ, Int Ctr Dielectr Res, Xian 710049, Shaanxi, Peoples R China
[3] Xian Technol Univ, Microoptoelect Syst Labs, Xian 710032, Shaanxi, Peoples R China
[4] Univ Sheffield, Dept Mat Sci & Engn, Sheffield S1 3JD, S Yorkshire, England
[5] Univ Sci & Technol China, Natl Synchrotron Radiat Lab, Hefei 230029, Anhui, Peoples R China
基金:
中国国家自然科学基金;
关键词:
THERMAL-EXPANSION;
LATTICE ENERGY;
BOND IONICITY;
SR;
BA;
CA;
TRANSITIONS;
PB;
D O I:
10.1021/acs.inorgchem.7b01462
中图分类号:
O61 [无机化学];
学科分类号:
070301 ;
081704 ;
摘要:
In the present work, a series of low-temperature firing scheelite structured microwave dielectric in water-insoluble La2O3 Nb2O5- V2O5 system was prepared via the traditional solid-state reaction method. Backscattering electron diffraction, X-ray diffraction (XRD), energy dispersive analysis, and Rietveld refinements were performed to study the phase evolution and:crystal structure. In the full composition range of (1 - x)LaNbO4-xLaVO(4) (0 <= x <= 0.9) ceramics, at least four typical phase regions including monoclinic fergusonite, tetragonal sheelite, B -site ordered sheelite, and composite of monoclinic LaVO4 and tetragonal sheelite phases can be detected according to XRD analysis. The variations of, relative dielectric constant epsilon(r), quality factor Q x f, and resonant frequency tau(f) could be attributed: to Nb/V-O bond ionicity, lattice energy, and the coefficient of thermal expansion. Infrared reflectivity spectra analysis revealed that ion polarization contributed mainly to the permittivity in microwave frequencies ranges. Furthermore, the 0.7LaNbO(4)-0.3LaVO(4) ceramic sintered at 1160 degrees C possessed excellent microwave dielectric properties with an epsilon(r) of similar to 17.78, a Q X f of similar to 75 940 GHz, and a tau(f) of ca. -36.8 ppm/degrees C. This series of materials might be good candidate for microwave devices.
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页码:9321 / 9329
页数:9
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