Structural and textural analyses of SiC-based and carbon CVD coatings by Raman Microspectroscopy

被引:15
作者
Chollon, G. [1 ]
机构
[1] Univ Bordeaux 1, Lab Composites Thermostruct, CNRS, Safran CEA UB1, F-33600 Pessac, France
关键词
Raman spectroscopy; microstructure; microtexture; silicon carbide; pyrocarbon; chemical vapour deposition (CVD);
D O I
10.1016/j.tsf.2007.06.098
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The polarization properties of Raman scattering have been utilized for the texture analysis of SiC-based and carbon coatings processed by CVD. A polarized Raman scattering analysis of the optical phonons was conducted to characterize the structural state of the SiC and aromatic carbon phases and appraise the possible preferential orientation of the SiC crystallites or the graphene layers in the coatings. This approach was applied through the Raman mappings of SiC-based and pyrocarbon coating cross-sections, for various structural materials such as CVD-monofilaments and C/C composites. The structural and textural properties of SiC and pyrocarbon coatings have been correlated with the CVD/CVI processes involved. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:388 / 396
页数:9
相关论文
共 11 条
  • [1] Low temperature pyrocarbons: A review
    Bourrat, Xavier
    Langlais, Francis
    Chollon, Georges
    Vignoles, Gerard Louis
    [J]. JOURNAL OF THE BRAZILIAN CHEMICAL SOCIETY, 2006, 17 (06) : 1090 - 1095
  • [2] Chollon G, 2005, HIGH TEMPERATURE CERAMIC MATRIX COMPOSITES 5, P557
  • [3] High temperature properties of SiC and diamond CVD-monofilaments
    Chollon, G
    Naslain, R
    Prentice, C
    Shatwell, R
    May, P
    [J]. JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2005, 25 (11) : 1929 - 1942
  • [4] RAMAN MICROPROBE STUDIES ON CARBON MATERIALS
    CUESTA, A
    DHAMELINCOURT, P
    LAUREYNS, J
    MARTINEZALONSO, A
    TASCON, JMD
    [J]. CARBON, 1994, 32 (08) : 1523 - 1532
  • [5] PHONON DISPERSION CURVES BY RAMAN SCATTERING IN SIC POLYTYPES 3C,4H,6H,15R,AND 21R
    FELDMAN, DW
    PARKER, JH
    CHOYKE, WJ
    PATRICK, L
    [J]. PHYSICAL REVIEW, 1968, 173 (03): : 787 - &
  • [6] In situ kinetic analysis of SiC filaments CVD
    Féron, O
    Chollon, G
    Dartigues, F
    Langlais, F
    Naslain, R
    [J]. DIAMOND AND RELATED MATERIALS, 2002, 11 (3-6) : 1234 - 1238
  • [7] Le Poche H, 2005, HIGH TEMPERATURE CERAMIC MATRIX COMPOSITES 5, P81
  • [8] RAMAN EFFECT IN CRYSTALS
    LOUDON, R
    [J]. ADVANCES IN PHYSICS, 1964, 13 (52) : 423 - &
  • [9] RELATIVE RAMAN INTENSITIES OF THE FOLDED MODES IN SIC POLYTYPES
    NAKASHIMA, S
    KATAHAMA, H
    NAKAKURA, Y
    MITSUISHI, A
    [J]. PHYSICAL REVIEW B, 1986, 33 (08): : 5721 - 5729
  • [10] Tunistra F, 1969, J CHEM PHYS, V53, P1126