Average Fade Duration of Triple Nakagami-m Random Process and Application in Wireless Relay Communication System

被引：2

作者：

Vulic, Ivan ^{[1
]}

Krstic, Dragana ^{[2
]}

Nikolic, Petar ^{[3
]}

Minic, Sinisa ^{[4
]}

Stefanovic, Mihajlo ^{[5
]}

机构：

[1] Univ Def, Belgrade, Serbia

[2] Univ Nis, Fac Elect Engn, Nish, Serbia

[3] TigarTyres, Pirot, Serbia

[4] Univ Pristina, Teachers Training Fac, Kosovska Mitrovica, Leposavic, Serbia

[5] Univ Nis, Fac Elect Engn, Nish, Serbia

来源：

2019 4TH INTERNATIONAL CONFERENCE ON SMART AND SUSTAINABLE TECHNOLOGIES (SPLITECH) | 2019年

关键词：

Average Fade Duration; Nakagami-m fading; Random Process; Relay Telecommunication Systems; LEVEL-CROSSING RATE;

D O I：

10.23919/splitech.2019.8783094

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

In this paper, the average fade duration (AFD) of the wireless relay communication system with three sections in the presence of Nakagami-m fading is determined and presented graphically. AFD is used to show how long a user is in continuous outage, below a specified level, after crossing that level in a downward direction. This result is useful in information theory, for example for coding design.

引用

页码：95 / 99

页数：5

共 22 条

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