Average Fade Duration of Triple Nakagami-m Random Process and Application in Wireless Relay Communication System

被引：2
|
作者：
Vulic, Ivan [1 ]
Krstic, Dragana [2 ]
Nikolic, Petar [3 ]
Minic, Sinisa [4 ]
Stefanovic, Mihajlo [5 ]
机构：
[1] Univ Def, Belgrade, Serbia
[2] Univ Nis, Fac Elect Engn, Nish, Serbia
[3] TigarTyres, Pirot, Serbia
[4] Univ Pristina, Teachers Training Fac, Kosovska Mitrovica, Leposavic, Serbia
[5] Univ Nis, Fac Elect Engn, Nish, Serbia
来源：
2019 4TH INTERNATIONAL CONFERENCE ON SMART AND SUSTAINABLE TECHNOLOGIES (SPLITECH) | 2019年
关键词：
Average Fade Duration; Nakagami-m fading; Random Process; Relay Telecommunication Systems; LEVEL-CROSSING RATE;
D O I：
10.23919/splitech.2019.8783094
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
In this paper, the average fade duration (AFD) of the wireless relay communication system with three sections in the presence of Nakagami-m fading is determined and presented graphically. AFD is used to show how long a user is in continuous outage, below a specified level, after crossing that level in a downward direction. This result is useful in information theory, for example for coding design.
引用
收藏
页码：95 / 99
页数：5
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