Temperature-dependent thermal conductivity in Mg-doped and undoped β-Ga2O3 bulk-crystals

被引:85
作者
Handwerg, M. [1 ,2 ]
Mitdank, R. [1 ]
Galazka, Z. [3 ]
Fischer, S. F. [1 ]
机构
[1] Humboldt Univ, AG Neue Mat, D-10099 Berlin, Germany
[2] Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany
[3] Leibniz Inst Crystal Growth, D-12489 Berlin, Germany
关键词
Ga2O3; thermal conductivity; 3 omega method; transparent conducting oxides; TCO; Umklapp scattering; SINGLE-CRYSTALS;
D O I
10.1088/0268-1242/30/2/024006
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
For beta-Ga2O3, only little information exists concerning the thermal properties, especially the thermal conductivity lambda. Here, the thermal conductivity is measured by applying the electrical 3 omega-method on Czochralski-grown beta-Ga2O3 bulk crystals, which have a thickness of 200 mu m and 800 mu mu m. At room temperature (RT), the thermal conductivity along the [100]-direction in Mgdoped electrical insulating and undoped semiconducting beta-Ga2O3 is confirmed as 13 +/- 1 Wm(-1)K(-1)for both crystals. The thermal conductivity increases for decreasing temperature down from 25 K to lambda (25 K)=(5.3 +/- 0.6) . 10(2)Wm(-1)K(-1). The phonon contribution of. dominates over the electron contribution below RT. The observed function lambda(T) is in accord with phonon-phonon-Umklapp scattering and the Debye model for the specific heat at T greater than or similar to 90 K which is about 0.1 times the Debye temperature theta(D). Here, a detailed discussion of the phonon-phonon-Umklapp scattering for T < theta(D) is carried out. The influence of point defect scattering is considered for T < 100 K.
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页数:5
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共 17 条
  • [1] Extending the 3ω-method to the MHz range for thermal conductivity measurements of diamond thin films
    Ahmed, S
    Liske, R
    Wunderer, T
    Leonhardt, M
    Ziervogel, R
    Fansler, C
    Grotjohn, T
    Asmussen, J
    Schuelke, T
    [J]. DIAMOND AND RELATED MATERIALS, 2006, 15 (2-3) : 389 - 393
  • [2] TRANSPORT RELAXATION-TIME FOR PHONON-IMPURITY SCATTERING
    ALTUKHOV, VI
    ZAVT, GS
    [J]. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1972, 54 (01): : 67 - 76
  • [3] THERMAL-CONDUCTIVITY MEASUREMENT FROM 30-K TO 750-K - THE 3-OMEGA METHOD
    CAHILL, DG
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (02) : 802 - 808
  • [4] THERMAL-CONDUCTIVITY OF AMORPHOUS SOLIDS ABOVE THE PLATEAU
    CAHILL, DG
    POHL, RO
    [J]. PHYSICAL REVIEW B, 1987, 35 (08): : 4067 - 4073
  • [5] Czochralski growth and characterization of β-Ga2O3 single crystals
    Galazka, Z.
    Uecker, R.
    Irmscher, K.
    Albrecht, M.
    Klimm, D.
    Pietsch, M.
    Bruetzam, M.
    Bertram, R.
    Ganschow, S.
    Fornari, R.
    [J]. CRYSTAL RESEARCH AND TECHNOLOGY, 2010, 45 (12) : 1229 - 1236
  • [6] On the bulk β-Ga2O3 single crystals grown by the Czochralski method
    Galazka, Zbigniew
    Irmscher, Klaus
    Uecker, Reinhard
    Bertram, Rainer
    Pietsch, Mike
    Kwasniewski, Albert
    Naumann, Martin
    Schulz, Tobias
    Schewski, Robert
    Klimm, Detlef
    Bickermann, Matthias
    [J]. JOURNAL OF CRYSTAL GROWTH, 2014, 404 : 184 - 191
  • [7] Transparent semiconducting oxides: materials and devices
    Grundmann, Marius
    Frenzel, Heiko
    Lajn, Alexander
    Lorenz, Michael
    Schein, Friedrich
    von Wenckstern, Holger
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2010, 207 (06): : 1437 - 1449
  • [8] Electronic and thermodynamic properties of β-Ga2O3
    He, Haiying
    Blanco, Miguel A.
    Pandey, Ravindra
    [J]. APPLIED PHYSICS LETTERS, 2006, 88 (26)
  • [9] Gallium oxide (Ga2O3) metal-semiconductor field-effect transistors on single-crystal β-Ga2O3 (010) substrates
    Higashiwaki, Masataka
    Sasaki, Kohei
    Kuramata, Akito
    Masui, Takekazu
    Yamakoshi, Shigenobu
    [J]. APPLIED PHYSICS LETTERS, 2012, 100 (01)
  • [10] Electrical properties of β-Ga2O3 single crystals grown by the Czochralski method
    Irmscher, K.
    Galazka, Z.
    Pietsch, M.
    Uecker, R.
    Fornari, R.
    [J]. JOURNAL OF APPLIED PHYSICS, 2011, 110 (06)