An automatic harmonic selection scheme based on spectrum analyzer measurements

被引：0

作者：

Rabijns, D ^{[1
]}

Vandersteen, G ^{[1
]}

Rolain, Y ^{[1
]}

Van Moer, W ^{[1
]}

Geens, A ^{[1
]}

Schoukens, J ^{[1
]}

机构：

[1] Free Univ Brussels, Dept ELEC TW, B-1050 Brussels, Belgium

来源：

ARFTG: AUTOMATIC RF TECHNIQUES GROUP, CONFERENCE DIGEST, FALL 2002: MEASUREMENTS NEEDS FOR EMERGING TECHNOLOGIES | 2002年

关键词：

non-linearities; signal detection; measurement; spectrum analyzer; statistics;

D O I：

10.1109/ARFTGF.2002.1218695

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Discerning noise from signal is often required for a correct interpretation of a spectrum. This paper presents a method to select automatically the significant spectral components in spectra, measured with a spectrum analyzer. No prior knowledge about the measured signals is required, and only commercially available equipment is used. The detection algorithm is based on the relationship between the resolution bandwidth (RBW) and the noise level of the spectrum analyzer. A statistical framework for the algorithm will be derived. The method will be demonstrated on simulations and measurements.

引用

页码：123 / 130

页数：8

共 9 条

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Van Moer, W
Rolain, Y
Schoukens, J
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