Unipolar Memristive Switching in Yttrium Oxide and RESET Current Reduction Using a Yttrium Interlayer

被引:17
作者
Pi, C. [1 ]
Ren, Y. [2 ]
Liu, Z. Q. [1 ]
Chim, W. K. [1 ,2 ]
机构
[1] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore
[2] Natl Univ Singapore, NUS Grad Sch Integrat Sci & Engn, Singapore 117456, Singapore
关键词
MEMORIES; MODEL;
D O I
10.1149/2.008203esl
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
We report on the unipolar resistive switching (RS) phenomenon in yttrium oxide (Y2O3) metal-insulator-metal structures. The RS behavior for Y2O3 shows a superior ON/OFF resistance ratio of greater than 106 and good memory retention reliability performance of at least 10(6) seconds at room temperature. By adding a thin yttrium (Y) layer to form a Y-Y2O3 bilayer structure, a reduction in the RESET current by two orders of magnitude is achieved, which is advantageous in reducing the total switching energy consumption for resistive random access memory application. (C) 2011 The Electrochemical Society. [DOI: 10.1149/2.008203esl] All rights reserved.
引用
收藏
页码:G5 / G7
页数:3
相关论文
共 13 条
  • [1] Random circuit breaker network model for unipolar resistance switching
    Chae, Seung Chul
    Lee, Jae Sung
    Kim, Sejin
    Lee, Shin Buhm
    Chang, Seo Hyoung
    Liu, Chunli
    Kahng, Byungnam
    Shin, Hyunjung
    Kim, Dong-Wook
    Jung, Chang Uk
    Seo, Sunae
    Lee, Myoung-Jae
    Noh, Tae Won
    [J]. ADVANCED MATERIALS, 2008, 20 (06) : 1154 - +
  • [2] Nanofilamentary resistive switching in binary oxide system; a review on the present status and outlook
    Kim, Kyung Min
    Jeong, Doo Seok
    Hwang, Cheol Seong
    [J]. NANOTECHNOLOGY, 2011, 22 (25)
  • [3] Understanding structure-property relationship of resistive switching oxide thin films using a conical filament model
    Kim, Kyung Min
    Lee, Min Hwan
    Kim, Gun Hwan
    Song, Seul Ji
    Seok, Jun Yeong
    Yoon, Jung Ho
    Hwang, Cheol Seong
    [J]. APPLIED PHYSICS LETTERS, 2010, 97 (16)
  • [4] Interface-modified random circuit breaker network model applicable to both bipolar and unipolar resistance switching
    Lee, S. B.
    Lee, J. S.
    Chang, S. H.
    Yoo, H. K.
    Kang, B. S.
    Kahng, B.
    Lee, M. -J.
    Kim, C. J.
    Noh, T. W.
    [J]. APPLIED PHYSICS LETTERS, 2011, 98 (03)
  • [5] Electrochemical deoxidation of yttrium-oxygen solid solutions
    Okabe, TH
    Deura, TN
    Oishi, T
    Ono, K
    Sadoway, DR
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 1996, 237 (1-2) : 150 - 154
  • [6] Resistive Switching Behavior in the Ru/Y2O3/TaN Nonvolatile Memory Device
    Pan, Tung-Ming
    Chen, Kai-Ming
    Lu, Chih-Hung
    [J]. ELECTROCHEMICAL AND SOLID STATE LETTERS, 2011, 14 (01) : II27 - II29
  • [7] Pergament AL, 2004, PHYS STATUS SOLIDI A, V201, P1543, DOI [10.1002/pssa.200306804, 10.1002/pass.200306804]
  • [8] Conductive-filament switching analysis and self-accelerated thermal dissolution model for reset in NiO-based RRAM
    Russo, U.
    Ielmini, D.
    Cagli, C.
    Lacaita, A. L.
    Spiga, S.
    Wiemer, C.
    Perego, M.
    Fanciulli, M.
    [J]. 2007 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, VOLS 1 AND 2, 2007, : 775 - +
  • [9] Voltage-time dilemma of pure electronic mechanisms in resistive switching memory cells
    Schroeder, Herbert
    Zhirnov, Victor V.
    Cavin, Ralph K.
    Waser, Rainer
    [J]. JOURNAL OF APPLIED PHYSICS, 2010, 107 (05)
  • [10] Nanoionics-based resistive switching memories
    Waser, RaineR
    Aono, Masakazu
    [J]. NATURE MATERIALS, 2007, 6 (11) : 833 - 840