共 13 条
- [7] Pergament AL, 2004, PHYS STATUS SOLIDI A, V201, P1543, DOI [10.1002/pssa.200306804, 10.1002/pass.200306804]
- [8] Conductive-filament switching analysis and self-accelerated thermal dissolution model for reset in NiO-based RRAM [J]. 2007 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, VOLS 1 AND 2, 2007, : 775 - +