Raman scattering from low-dimensional semiconductors

被引：0

作者：

Nesheva, D ^{[1
]}

机构：

[1] Inst Solid State Phys, Sofia 1784, Bulgaria

来源：

Nanostructured and Advanced Materials for Applications in Sensor, Optoelectronic and Photovoltaic Technology | 2005年 / 204卷

关键词：

GLASS MATRIX; SIZE; MULTILAYERS; SILICON; MICROCRYSTALLINE; NANOCRYSTALS; STABILITY; SHIFTS; FILMS; DOTS;

D O I：

10.1007/1-4020-3562-4_24

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：317 / 322

页数：6

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