1 μs broadband frequency sweeping reflectometry for plasma density and fluctuation profile measurements

被引：28

作者：

Clairet, F. ^{[1
]}

Bottereau, C. ^{[1
]}

Medvedeva, A. ^{[1
,2
,3
,4
]}

Molina, D. ^{[1
]}

Conway, G. D. ^{[2
]}

Silva, A. ^{[5
]}

Stroth, U. ^{[2
,3
]}

机构：

[1] CEA, IRFM, F-13108 St Paul Les Durance, France

[2] Max Planck Inst Plasma Phys, D-85748 Garching, Germany

[3] Tech Univ Munich, Phys Dept E28, D-85747 Garching, Germany

[4] Univ Lorraine, Inst Jean Lamour, UMR CNRS 7198, F-54000 Nancy, France

[5] Univ Lisbon, IST, Inst Plasmas & Fusao Nucl, P-104900 Lisbon, Portugal

[6] EUROfus Programme Management Unit, Boltzmannstr 2, D-85748 Garching, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2017年 / 88卷 / 11期

关键词：

MICROWAVE REFLECTOMETRY; TORE-SUPRA; TOKAMAK; SYSTEM; MODE;

D O I：

10.1063/1.4991789

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Frequency swept reflectometry has reached the symbolic value of 1 mu s sweeping time; this performance has been made possible, thanks to an improved control of the ramp voltage driving the frequency source. In parallel, the memory depth of the acquisition system has been upgraded and can provide up to 200 000 signals during a plasma discharge. Additional improvements regarding the trigger delay determination of the acquisition and the voltage ramp linearity required by this ultra-fast technique have been set. While this diagnostic is traditionally dedicated to the plasma electron density profile measurement, such a fast sweeping rate can provide the study of fast plasma events and turbulence with unprecedented time and radial resolution from the edge to the core. Experimental results obtained on ASDEX Upgrade plasmas are presented to demonstrate the performances of the diagnostic. Published by AIP Publishing.

引用

页数：5

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