Study of the 42CrMo4 steel surface by quantitative XPS electron spectroscopy

被引：15

作者：

Flori, M. ^{[1
]}

Gruzza, B. ^{[2
]}

Bideux, L. ^{[2
]}

Monier, G. ^{[2
]}

Robert-Goumet, C. ^{[2
]}

机构：

[1] Politehn Univ Timisoara, Fac Engn Hunedoara, Hunedoara 331128, Romania

[2] Univ Clermont Ferrand, CNRS, LASMEA, UMR 6602, F-63177 Aubiere, France

来源：

APPLIED SURFACE SCIENCE | 2008年 / 254卷 / 15期

关键词：

steel; iron oxide; X-ray photoelectron spectroscopy; argon ion sputtering; depth profiling;

D O I：

10.1016/j.apsusc.2008.01.090

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Quantitative X-ray photoelectron spectroscopy was used to characterize the native oxide film formed on 42CrMo4 steel surface by air exposure in normal conditions. In order to determine the thickness and composition of the oxide layer we have used a stacking layer model together with experimental XPS sputtering depth profiling. At a nanoscale study, to obtain quantitative results one must take into account fundamental parameters like the attenuation depth of photoelectrons. We have found that both lepidocrocit (gamma-FeOOH) and magnetite (Fe(3)O(4)) were present and the total thickness of the oxide layer was 16 monolayers. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：4738 / 4743

页数：6

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