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TM and TE diffraction by a perfectly conducting half-plane in presence of a perfectly conducting strip: Solution by exponentially converging Nystrom and Galerkin methods
被引:4
|作者:
Tsalamengas, J. L.
[1
]
机构:
[1] Natl Tech Univ Athens, Dept Elect & Comp Engn, GR-15773 Athens, Greece
关键词:
electromagnetic diffraction;
Galerkin method;
integral equations;
Nystrom method;
strip scatterers;
D O I:
10.1109/TAP.2008.922221
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
We study TM and TE diffraction by a perfectly conducting half-plane in presence of a perfectly conducting flat strip of finite width and infinite length; the edges of the strip are parallel to the edge of the half-plane. The relevant integral equations with unknowns the induced current densities on the strip are solved by a Nystrom and a Galerkin method that fully account for the singular nature of the kernels and the singularities of the solution at the edges. The proposed algorithms are highly accurate, and appear to converge exponentially as shown by detailed numerical examples and case studies. The Nystrom method is the most efficient of the two methods because of its simple formulation, fast computer implementation, and much less effort in computing the matrix elements. When the strip is coplanar to the half-plane, an additional formulation method in terms of equivalent surface magnetic currents is possible in the framework of the field equivalence principles. This alternative method is applied in order to validate the algorithms and test their accuracy.
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页码:1358 / 1367
页数:10
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