FDTD study of the surface waves detection in apertureless scanning near-field microscopy

被引：0
|
作者：
Parent, G. [1 ]
Fumeron, S. [1 ]
Lacroix, D. [1 ]
机构：
[1] Nancy Univ, LEMTA, F-54506 Vandoeuvre Les Nancy, France
来源：
PROCEEDINGS OF THE MICRO/NANOSCALE HEAT TRANSFER INTERNATIONAL CONFERENCE 2008, PTS A AND B | 2008年
关键词：
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
Recent studies have shown the importance of surface waves in heat transfer near interfaces. The scanning near field optical microscopy (SNOM) provides an experimental tool to investigate the thermal electromagnetic field near surfaces. In this work, we present a three dimensional model of SNOM devices. This model is based on the finite-difference-time domain (FDTD) method associated to a near to far field transformation. Near field and far field scattered by a silicon tetrahedral tip and by a pecfectly conducting one are presented and discussed
引用
收藏
页码：1243 / 1249
页数：7
相关论文
共 50 条
  • [21] Apertureless near-field optical microscopy
    Kazantsev, D. V.
    Kuznetsov, E. V.
    Timofeev, S. V.
    Shelaev, A. V.
    Kazantseva, E. A.
    PHYSICS-USPEKHI, 2017, 60 (03) : 259 - 275
  • [22] Scanning apertureless near field microscopy
    Berland, KM
    Wickramasinghe, HK
    BIOPHYSICAL JOURNAL, 1998, 74 (02) : A182 - A182
  • [23] An analysis of heterodyne signals in apertureless scanning near-field optical microscopy
    Chuang, Chin-Ho
    Lo, Yu-Lung
    OPTICS EXPRESS, 2008, 16 (22): : 17982 - 18003
  • [24] Apertureless near-field scanning IR microscopy of rough surfaces.
    Akhremitchev, BB
    Walker, GC
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 221 : U71 - U71
  • [25] Error signal artifact in apertureless scanning near-field optical microscopy
    Billot, L.
    Lamy de la Chapelle, M.
    Barchiesi, D.
    Chang, S. -H.
    Gray, S. K.
    Rogers, J. A.
    Bouhelier, A.
    Adam, P. -M.
    Bijeon, J. -L.
    Wiederrecht, G. P.
    Bachelot, R.
    Royer, P.
    APPLIED PHYSICS LETTERS, 2006, 89 (02)
  • [26] Coherent scattering phenomena in apertureless scanning near-field fluorescence microscopy
    Diziain, S.
    Adam, P.-M.
    Bijeon, J.-L.
    Royer, P.
    OPTICS COMMUNICATIONS, 2007, 276 (01) : 180 - 185
  • [27] Factors that influence confocal apertureless near-field scanning optical microscopy
    Protasenko, VV
    Gallagher, A
    Nesbitt, DJ
    OPTICS COMMUNICATIONS, 2004, 233 (1-3) : 45 - 56
  • [28] Scattering-type apertureless scanning near-field optical microscopy
    Kazantsev, D., V
    Kazantseva, E. A.
    PHYSICS-USPEKHI, 2024, 67 (06) : 588 - 628
  • [29] Recovering of the apertureless scanning near-field optical microscopy signal through a lock-in detection
    Diziain, S.
    Barchiesi, D.
    Grosges, T.
    Adam, P. -M.
    APPLIED PHYSICS B-LASERS AND OPTICS, 2006, 84 (1-2): : 233 - 238
  • [30] Recovering of the apertureless scanning near-field optical microscopy signal through a lock-in detection
    S. Diziain
    D. Barchiesi
    T. Grosges
    P.-M. Adam
    Applied Physics B, 2006, 84 : 233 - 238
12345