Dependence of THz Metamaterial Resonance on Doping Carrier Density and Pattern Line Width

被引：0

作者：

Lee, Y. U. ^{[1
]}

Choi, E. Y. ^{[1
]}

Kim, E. S. ^{[1
]}

Woo, J. H. ^{[1
]}

Park, Byung Cheol ^{[2
]}

Kim, Jae Hoon ^{[2
]}

Wu, J. W. ^{[1
]}

机构：

[1] Ewha Womans Univ, Dept Phys, Quantum Metamat Res Ctr, Seoul 120750, South Korea

[2] Yonsei Univ, Dept Phys, Seoul 120749, South Korea

来源：

2013 7TH INTERNATIONAL CONGRESS ON ADVANCED ELECTROMAGNETIC MATERIALS IN MICROWAVES AND OPTICS (METAMATERIALS 2013) | 2013年

关键词：

SUPERLATTICE;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A series of THz metamaterials were fabricated, which have different pattern line widths of Au and different doping carrier densities of p-type silicon substrate. Transmission spectra of the metamaterials were obtained by a terahertz time domain spectroscopic measurement. Upon increasing the doping carrier density and narrowing the pattern line width, the transmission spectra showed a blue shift in resonance frequency and a broadening of resonance spectral shape, i.e., a decrease in quality factor.

引用

页码：505 / 507

页数：3

共 47 条

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