An adaptive system for speckle pattern interferometry

被引：0
|
作者：
Kornis, J [1 ]
Nemeth, A [1 ]
Moustafa, N [1 ]
机构：
[1] Tech Univ Budapest, Dept Phys, H-1111 Budapest, Hungary
来源：
INTERNATIONAL CONFERENCE ON APPLIED OPTICAL METROLOGY | 1998年 / 3407卷
关键词：
speckle metrology; electronic speckle pattern interferometry; TV holography; adaptive metrology; comparative measurement; holographic optical element; adaptive speckle pattern interferometry;
D O I：
10.1117/12.323323
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
In our paper we have analysed the application possibility of a modified version of speckle pattern interferometry: the adaptive speckle pattern interferometry (ASPI). The core of this technique is the using of the holographically reconstructed virtual images of reference waves. Using this solution an adaptive measuring system can be built. A developed prototype of the ASPI has been presented as a measuring device for various measuring tasks. Selected applications have been shown from real time holography to comparative displacement or contour measurement.
引用
收藏
页码：267 / 272
页数：6
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