An adaptive system for speckle pattern interferometry

In our paper we have analysed the application possibility of a modified version of speckle pattern interferometry: the adaptive speckle pattern interferometry (ASPI). The core of this technique is the using of the holographically reconstructed virtual images of reference waves. Using this solution an adaptive measuring system can be built. A developed prototype of the ASPI has been presented as a measuring device for various measuring tasks. Selected applications have been shown from real time holography to comparative displacement or contour measurement.