Resolution and aberration correction in liquid cell transmission electron microscopy

被引:133
|
作者
de Jonge, Niels [1 ,2 ]
Houben, Lothar [3 ,4 ,5 ]
Dunin-Borkowski, Rafal E. [3 ,4 ]
Ross, Frances M. [6 ,7 ]
机构
[1] INM Leibniz Inst New Mat, Saarbrucken, Germany
[2] Saarland Univ, Dept Phys, Saarbrucken, Germany
[3] Forschungszentrum Julich, Ernst Ruska Ctr Microscopy & Spect Electrons, Julich, Germany
[4] Forschungszentrum Julich, Peter Grunberg Inst, Julich, Germany
[5] Weizmann Inst Sci, Dept Chem Res Support, Rehovot, Israel
[6] IBM TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
[7] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
关键词
IN-SITU; GOLD NANOPARTICLES; SPATIAL-RESOLUTION; RADIATION-DAMAGE; GROWTH; WATER; TEM; VISUALIZATION; MOTION; STEM;
D O I
10.1038/s41578-018-0071-2
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Liquid cell electron microscopy possesses a combination of spatial and temporal resolution that provides a unique view of static structures and dynamic processes in liquids. Optimizing the resolution in liquids requires consideration of both the microscope performance and the properties of the sample. In this Review, we survey the competing factors that determine spatial and temporal resolution for transmission electron microscopy and scanning transmission electron microscopy of liquids. We discuss the effects of sample thickness, stability and dose sensitivity on spatial and temporal resolution. We show that for some liquid samples, spatial resolution can be improved by spherical and chromatic aberration correction. However, other benefits offered by aberration correction may be even more useful for liquid samples. We consider the greater image interpretability offered by spherical aberration correction and the improved dose efficiency for thicker samples offered by chromatic aberration correction. Finally, we discuss the importance of detector and sample parameters for higher resolution in future experiments.
引用
收藏
页码:61 / 78
页数:18
相关论文
共 50 条
  • [31] Considerations for imaging thick, low contrast, and beam sensitive samples with liquid cell transmission electron microscopy
    Moser, Trevor H.
    Shokuhfar, Tolou
    Evans, James E.
    MICRON, 2019, 117 : 8 - 15
  • [32] Atomic resolution liquid-cell transmission electron microscopy investigations of the dynamics of nanoparticles in ultrathin liquids
    Zhu, Guomin
    Jiang, Yingying
    Huang, Wei
    Zhang, Hui
    Lin, Fang
    Jin, Chuanhong
    CHEMICAL COMMUNICATIONS, 2013, 49 (93) : 10944 - 10946
  • [33] High-resolution mapping of molecules in an ionic liquid via scanning transmission electron microscopy
    Miyata, Tomohiro
    Mizoguchi, Teruyasu
    MICROSCOPY, 2018, 67 : i162 - i167
  • [34] Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished Specimens
    Zhong, Xiang Li
    Schilling, Sibylle
    Zaluzec, Nestor J.
    Burke, M. Grace
    MICROSCOPY AND MICROANALYSIS, 2016, 22 (06) : 1350 - 1359
  • [35] Chromatic Aberration-Corrected Tilt Series Transmission Electron Microscopy of Nanoparticles in a Whole Mount Macrophage Cell
    Baudoin, Jean-Pierre
    Jinschek, Joerg R.
    Boothroyd, Chris B.
    Dunin-Borkowski, Rafal E.
    de Jonge, Niels
    MICROSCOPY AND MICROANALYSIS, 2013, 19 (04) : 814 - 820
  • [36] The first observation of titanate nanotubes by spherical aberration corrected high-resolution transmission electron microscopy
    Miao, L.
    Tanemura, S.
    Jiang, T.
    Tanemura, M.
    Yoshida, K.
    Tanaka, N.
    Xu, G.
    SUPERLATTICES AND MICROSTRUCTURES, 2009, 46 (1-2) : 357 - 364
  • [37] Aberration Correction for Large-Angle Illumination Scanning Transmission Electron Microscopy by Using Iterative Electron Ptychography Algorithms
    Ma, Yinhang
    Shi, Jinan
    Guzman, Roger
    Li, Ang
    Zhou, Wu
    MICROSCOPY AND MICROANALYSIS, 2024, 30 (02) : 226 - 235
  • [38] High-Resolution Imaging and Spectroscopy at High Pressure: A Novel Liquid Cell for the Transmission Electron Microscope
    Tanase, Mihaela
    Winterstein, Jonathan
    Sharma, Renu
    Aksyuk, Vladimir
    Holland, Glenn
    Liddle, James A.
    MICROSCOPY AND MICROANALYSIS, 2015, 21 (06) : 1629 - 1638
  • [39] The Influence of the Sample Thickness on the Lateral and Axial Resolution of Aberration-Corrected Scanning Transmission Electron Microscopy
    Ramachandra, Ranjan
    Demers, Hendrix
    de Jonge, Niels
    MICROSCOPY AND MICROANALYSIS, 2013, 19 (01) : 93 - 101
  • [40] Determination of aberration center of Ronchigram for automated aberration correctors in scanning transmission electron microscopy
    Sannomiya, Takumi
    Sawada, Hidetaka
    Nakamichi, Tomohiro
    Hosokawa, Fumio
    Nakamura, Yoshio
    Tanishiro, Yasumasa
    Takayanagi, Kunio
    ULTRAMICROSCOPY, 2013, 135 : 71 - 79