Growth and magnetic properties of La0.65Pb0.35MnO3 films

We have successfully grown La0.65Pb0.35MnO3 thin films by a RF magnetron sputtering method onto (100) LaAlO3 single crystal substrates. X-ray diffraction measurements are consistent with a (100) cubic orientation of the films. The fourfold symmetry showed by IRE (Low Energy Electron Diffraction) patterns indicate that the films have surface order. STM(Scanning Tunneling Microscopy) measurements indicate that the surface of the films were smooth, with approximate 5 nm roughness. XPS (X-ray Photoemission Spectroscopy) shows that the surface defect density in the films is comparatively low. The bulk magnetization of the films at 6K in 1 T magnetic field reached 77 emu/g and a Curie temperature near 354 K, close to maximum resistivity. A negative magnetoresistance of 47% was observed at 320K in 5.5 T magnetic field.