[1] Univ Surrey, Dept Phys, Guildford GU2 5XH, Surrey, England
来源:
ELECTROMAGNETIC NONDESTRUCTIVE EVALUATION (II)
|
1998年
/
14卷
关键词:
D O I:
暂无
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
The eddy-current probe impedance due to a crack at the surface of a conductor has been predicted using the assumption that the skin-depth of the induced current is much smaller that the length and depth of the flaw. This assumption defines the thin-skin regime in which it is possible to predict the probe signals from solutions of the two-dimensional Laplace equation in a domain that corresponds to the crack face. Solutions for semi-elliptical and other curved crack shapes have been found by conformal mapping. Comparison of theoretical predictions and experimental measurements of probe impedance due to simulated cracks show good agreement.