Microstructural characteristics and electrical resistivity of rapidly solidified Co-Sn alloys

被引:6
|
作者
Xu, JF [1 ]
Wang, N [1 ]
Wei, BH [1 ]
机构
[1] Northwestern Polytech Univ, Dept Appl Phys, Lab Mat Sci Space, Xian 710072, Peoples R China
来源
CHINESE SCIENCE BULLETIN | 2004年 / 49卷 / 21期
基金
中国国家自然科学基金;
关键词
rapid solidification; dendritic growth; eutectic growth; electrical resistivity;
D O I
10.1360/04ww0066
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The rapid solidification behavior of Co-Sn alloys was investigated by melt spinning method. The growth morphology of alphaCo phase in Co-20%Sn hypoeutectic alloy changes sensitively with cooling rate. A layer of columnar alphaCo dendrite forms near the roller side at low cooling rates. This region becomes small and disappears as the cooling rate increases and a kind of very fine homogeneous microstructure characterized by the distribution of equiaxed alphaCo dendrites in gammaCO(3)Sn matrix is subsequently produced. For Co-34.2%Sn eutectic alloy, anomalous eutectic forms within the whole range of cooling rates. The increase of cooling rate has two obvious effects on both alloys: one is the microstructure refinement, and the other is that it produces more crystal defects to intensify the scattering of free electrons, leading to a remarkable increase of electrical resistivity. Under the condition that the grain boundary reflection coefficient r approaches 1, the resistivity of rapidly solidified Co-Sn alloys can be predicted theoretically.
引用
收藏
页码:2242 / 2247
页数:6
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