Photoresist etching by atmospheric pressure uniform-glow plasma

被引:7
作者
Wang, Shouguo
Xu, Xiangyu
Zhao, Lingli
Ye, Tianchun
机构
[1] Chinese Acad Sci, Acad Optoelect, Beijing 100010, Peoples R China
[2] Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2007年 / 46卷 / 8A期
关键词
atmospheric pressure; radio-frequency discharge; photoresist etching; temperature characteristics; DISCHARGE;
D O I
10.1143/JJAP.46.5294
中图分类号
O59 [应用物理学];
学科分类号
摘要
An atmospheric pressure uniform-glow plasma (APUGP) operated by radio-frequency (RF) power at 13.56 MHz has been developed for etching, cleaning, surface treatment, and deposition of thin films among others. This plasma employs a capacitive coupling electrode design and produces a stable, volumetric glow discharge in a large disc area of 150 mm diameter using argon and oxygen mixture gas at atmospheric pressure. Its electrical characteristics were obtained by simultaneous measurements of voltage and current. In addition, typical photoresist-AZ9918 films spin-coated on 4-in. silicon wafers have been etched using this plasma source, which shows promise for replacing low-pressure plasma devices for some existing applications.
引用
收藏
页码:5294 / 5296
页数:3
相关论文
共 10 条
[1]   OXYGEN PLASMA-ETCHING FOR RESIST STRIPPING AND MULTILAYER LITHOGRAPHY [J].
HARTNEY, MA ;
HESS, DW ;
SOANE, DS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (01) :1-13
[2]   OPEN-AIR PHOTORESIST ASHING BY A COLD-PLASMA TORCH - CATALYTIC EFFECT OF CATHODE MATERIAL [J].
INOMATA, K ;
KOINUMA, H ;
OIKAWA, Y ;
SHIRAISHI, T .
APPLIED PHYSICS LETTERS, 1995, 66 (17) :2188-2190
[3]   An atmospheric pressure plasma source [J].
Park, J ;
Henins, I ;
Herrmann, HW ;
Selwyn, GS ;
Jeong, JY ;
Hicks, RF ;
Shim, D ;
Chang, CS .
APPLIED PHYSICS LETTERS, 2000, 76 (03) :288-290
[4]   Low-pressure plasma cleaning: a process for precision cleaning applications [J].
Petasch, W ;
Kegel, B ;
Schmid, H ;
Lendenmann, K ;
Keller, HU .
SURFACE & COATINGS TECHNOLOGY, 1997, 97 (1-3) :176-181
[5]  
Sargent J, 1997, SOLID STATE TECHNOL, V40, P171
[6]  
Selwyn GS, 2001, CONTRIB PLASM PHYS, V41, P610, DOI 10.1002/1521-3986(200111)41:6<610::AID-CTPP610>3.0.CO
[7]  
2-L
[8]   Discharge comparison of nonequilibrium atmospheric pressure Ar/O2 and He/O2 plasma jets [J].
Wang, S ;
Schulz-von der Gathen, V ;
Döbele, HF .
APPLIED PHYSICS LETTERS, 2003, 83 (16) :3272-3274
[9]  
WANG S, 2004, Patent No. 2004200038655
[10]   Localized removal of a photoresist by atmospheric pressure micro-plasma jet using RF corona discharge [J].
Yoshiki, H ;
Taniguchi, K ;
Horiike, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (09) :5797-5798