Agile linear interferometric method for carrier-envelope phase drift measurement

被引：14
作者：
Jojart, P. [1 ,2 ]
Boerzsoenyi, A. [1 ,2 ]
Borchers, B. [3 ]
Steinmeyer, G. [3 ,4 ]
Osvay, K. [1 ]
机构：
[1] Univ Szeged, Dept Opt & Quantum Elect, H-6701 Szeged, Hungary
[2] CE Opt Kft, H-6720 Szeged, Hungary
[3] Max Born Inst, D-12489 Berlin, Germany
[4] Tampere Univ Technol, Optoelect Res Ctr, FIN-33101 Tampere, Finland
来源：
OPTICS LETTERS | 2012年 / 37卷 / 05期
关键词：
OFFSET PHASE; SPECTRAL INTERFEROMETRY; LASER-PULSES; STABILIZATION; GENERATION; DISPERSION;
D O I：
10.1364/OL.37.000836
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A bandwidth-independent and linear interferometric method for the measurement of the carrier-envelope phase drift of ultrashort pulse trains is demonstrated. The pulses are temporally overlapped in a resonant multiple-beam interferometer. From the position of the spectral interference pattern, the relative carrier-envelope phase between two subsequent oscillator pulses is obtained at data acquisition rates up to 200 Hz. Cross calibration has been performed by f-to-2f interferometry in two independent experiments. The optical length of the interferometer has been actively stabilized, leading to a phase jitter of 117 mrad (rms). These results indicate a reduced noise and quicker data acquisition in comparison with previous linear methods for measuring the carrier-envelope phase drift. (C) 2012 Optical Society of America
引用
收藏
页码：836 / 838
页数：3
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