Ferromagnetic Resonance Investigations of Exchange Biased NiFe/IrMn/NiFe Trilayer Structures

被引：0

作者：

Dzhun, I. O. ^{[1
]}

Babaytsev, G., V ^{[1
]}

Makunin, A., V ^{[1
]}

Romashkina, I. L. ^{[1
]}

Kozin, M. G. ^{[1
]}

Chechenin, N. G. ^{[1
]}

机构：

[1] Lomonosov Moscow State Univ, Skobeltsyn Inst Nucl Phys, Moscow 119991, Russia

来源：

MOSCOW UNIVERSITY PHYSICS BULLETIN | 2022年 / 77卷 / 04期

关键词：

nanomagnetics; exchange bias; ferromagnetic resonance; trilayer thin film structures; uniaxial anisotropy; unidirectional anisotropy; ferromagnet/antiferromagnet; THICKNESS;

D O I：

10.3103/S002713492204004X

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Trilayer thin-film magnetic structures NiFe/IrMn/NiFe obtained by DC magnetron sputtering in the presence of a constant magnetic field 420 Oe were investigated by ferromagnetic resonance (FMR) technique. The dependences of the exchange bias, misalignment angle between the uniaxial and unidirectional anisotropies, and the FMR linewidth on the thickness of the antiferromagnetic IrMn layer in the range from 2 to 50 nm are compared for samples with hard Ni40Fe60 and soft Ni75Fe25 ferromagnetic layers of the same 10 nm thickness. Using the data of other authors and our previous data for bilayer structures, possible reasons of the observed dependences are discussed.

引用

页码：639 / 644

页数：6

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