Power-Recycled Weak-Value-Based Metrology

被引：51

作者：

Lyons, Kevin ^{[1
,2
]}

Dressel, Justin ^{[3
]}

Jordan, Andrew N. ^{[1
,2
,4
]}

Howell, John C. ^{[1
,2
]}

Kwiat, Paul G. ^{[5
]}

机构：

[1] Univ Rochester, Dept Phys & Astron, Rochester, NY 14627 USA

[2] Univ Rochester, Ctr Coherence & Quantum Opt, Rochester, NY 14627 USA

[3] Univ Calif Riverside, Dept Elect & Comp Engn, Riverside, CA 92521 USA

[4] Chapman Univ, Inst Quantum Studies, Orange, CA 92866 USA

[5] Univ Illinois, Dept Phys, Urbana, IL 61801 USA

来源：

PHYSICAL REVIEW LETTERS | 2015年 / 114卷 / 17期

关键词：

SPIN;

D O I：

10.1103/PhysRevLett.114.170801

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We improve the precision of the interferometric weak-value-based beam deflection measurement by introducing a power recycling mirror, creating a resonant cavity. This results in all the light exiting to the detector with a large deflection, thus eliminating the inefficiency of the rare postselection. The signal-to-noise ratio of the deflection is itself magnified by the weak value. We discuss ways to realize this proposal, using a transverse beam filter and different cavity designs.

引用

页数：5

共 18 条

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